Nanometer scale masked ion damage barriers in YBa/sub 2/Cu/sub 3/O/sub 7-δ/

Kang, Dae Joon; Speaks, R.; Peng, Nianhua; Webb, R.P.; Jeynes, C.; Booij, W.E.; Tarte, E.J.; Moore, David F.; Blamire, M. G.

doi:10.1109/77.919461

Cited by 6 publications

(2 citation statements)

References 11 publications

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“…Promising results had been observed [9], but the YBCO thin film after the FIB process was very sensitive to the proton beam irradiation. Similar results had been obtained with a pure Au masked fabrication process [14]. By exposing an YBCO thin film to the Ga beam deliberately and followed by proton beam irradiation damage for both Ga exposed and Ga free samples at the same time, the detrimental effect of Ga contamination and proton beam assisted diffusion of Ga in YBCO on superconductivity has been well established.…”

Section: Introductionsupporting

confidence: 66%

High quality YBa/sub 2/Cu/sub 3/O/sub 7-δ Josephson junctions and junction arrays fabricated by masked proton beam irradiation damage

Peng

Kang

Jeynes

et al. 2003

IEEE Trans. Appl. Supercond.

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High quality single Josephson junctions and junction arrays with 10 junctions in series have been fabricated using masked proton beam irradiation damage technology. Monte Carlo simulation of the irradiation damage profile underneath the metal mask has been carried out systematically to guide the metal mask structure design. A high resolution and high aspect ratio metal mask opening was fabricated by focused 30 keV Ga ion beam milling. Various nonconducting oxide buffer layers have been investigated for a Ga contamination free mask fabrication. A contamination free irradiation process and subsequent removal of metal mask after ion irradiation are the keys for the improved properties of junctions fabricated with YBCO.

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Section: Introductionsupporting

confidence: 66%

High quality YBa/sub 2/Cu/sub 3/O/sub 7-δ Josephson junctions and junction arrays fabricated by masked proton beam irradiation damage

Peng

Kang

Jeynes

et al. 2003

IEEE Trans. Appl. Supercond.

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“…Figure 2 shows the schematic drawing of the experimental apparatus for electrical AC loss measurement with the electrical method. According to Kang et al [46], when an AC current transports in a superconductor tape, a magnetic flux is induced in the voltage lead (Ampere's law), and a voltage is also induced in the voltage lead (Maxwell's law): where V is the induced voltage. The first integral term represents the inductive component and the second one is the resistive component of the induced voltage.…”

Section: Critical Current and Electrical Losses (Power Consumption) M...mentioning

confidence: 99%

Transport AC losses of Ag-sheathed Bi-2223 tapes with different twist-pitch using electrical methods

Jang¹,

Wong‐Ng²

2005

Supercond. Sci. Technol.

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A series of Bi-2223 ([Bi, Pb]:Sr:Ca:Cu:O = 2:2:2:3) tapes with 37 superconducting core filaments was investigated in an attempt to correlate critical current and alternating current (AC) losses with twist-pitch. The twist-pitch of these multi-filamentary tapes which were produced by the powder-in-(Ag)tube (PIT) method varies from 8, 10, 13, 30, 50, 70 mm to ∞ mm (non-twist). Critical current (I c) measurements which were conducted in zero field by a four-probe method under liquid-nitrogen temperature showed that I c is greater in the non-twist filament than that in twisted filaments. Among these tapes, three (twist-pitch of 10, 13, and 70 mm) were selected for AC loss experiments under a time-varying transport current. The results of AC loss measurements in general agree with that of the AC loss simulation using the ellipse model of the Norris equation. Simulation results show that the hysteretic AC loss is lowest in the non-twist tape and increases as the twist-pitch decreases. A much greater loss was found in tapes with small twist-pitch, i.e. 10 and 8 mm. Among different possible loss contributions to the total AC losses, the hysteretic loss was determined to be the main source. In addition, microstructural damage of tapes with small twist-pitch appears to contribute to the overall AC losses as well.

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