Nanometer-Scale Solvent-Assisted Modification of Polymer Surfaces Using the Atomic Force Microscope

Leach, R. N.; Stevens, Forrest; Seiler, Charles J.; Langford, S. C.; Dickinson, J. T.

doi:10.1021/la035289n

Cited by 26 publications

(25 citation statements)

References 36 publications

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“…Via a thermal post treatment the solvent can be finally removed, however the process depends on several parameters such as temperature, time, and solvent employed. Therefore assessing the amount and the type of solvent present is very crucial for the rippling process [ 13 , 15 , 23 – 24 43 ]. In Fig.…”

Section: Reviewmentioning

confidence: 99%

Nanoscale rippling on polymer surfaces induced by AFM manipulation

D’Acunto¹,

Dinelli²,

Pingue³

2015

Beilstein J. Nanotechnol.

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SummaryNanoscale rippling induced by an atomic force microscope (AFM) tip can be observed after performing one or many scans over the same area on a range of materials, namely ionic salts, metals, and semiconductors. However, it is for the case of polymer films that this phenomenon has been widely explored and studied. Due to the possibility of varying and controlling various parameters, this phenomenon has recently gained a great interest for some technological applications. The advent of AFM cantilevers with integrated heaters has promoted further advances in the field. An alternative method to heating up the tip is based on solvent-assisted viscoplastic deformations, where the ripples develop upon the application of a relatively low force to a solvent-rich film. An ensemble of AFM-based procedures can thus produce nanoripples on polymeric surfaces quickly, efficiently, and with an unprecedented order and control. However, even if nanorippling has been observed in various distinct modes and many theoretical models have been since proposed, a full understanding of this phenomenon is still far from being achieved. This review aims at summarizing the current state of the art in the perspective of achieving control over the rippling process on polymers at a nanoscale level.

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Section: Reviewmentioning

confidence: 99%

Nanoscale rippling on polymer surfaces induced by AFM manipulation

D’Acunto¹,

Dinelli²,

Pingue³

2015

Beilstein J. Nanotechnol.

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“…For instance, we have produced bumps on PMMA by small area scanning at modest contact forces in weak solvents, including dilute ethanol solutions. 18 Weak solvents require mechanical stimulation by the atomic force microscope tip for significant solvent uptake in the PMMA. is much more volatile than the solvents used to cast our films (propylene glycol methyl ether acetate, T b ≈ 145 °C; γ-butyrolactone, T b ≈ 204 °C), which is consistent with film densification.…”

Section: A Pit Formationmentioning

confidence: 99%

Nanoscale craters in poly(methyl methacrylate) formed by exposure to condensing solvent vapor

et al. 2007

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We report atomic force microscope observations of small pits formed on thin poly(methyl methacrylate) films after exposure to formic acid vapor, which condenses to form small drops on the surface and then evaporates. This procedure produces large numbers of small pits, 50–5000 nm in diameter, with aspect ratios (depth-to-diameter) as high as 0.5. About 25% of the volume removed from high-aspect-ratio pits has been transported to form a raised ring around the rim of the pit. We attribute the remaining 75% of the volume loss to densification of the surrounding polymer. Nanoindentation measurements show that material inside the pits is harder and stiffer than material outside the pits, consistent with densification. The effects of solvent concentration, exposure time, and exposure to ammonia vapor are described. Similar treatments with volatile solvents have potential applications in large-scale surface patterning, submicron hole formation, and controlled alteration of surface properties.

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“…The shear moduli of PIB/PCHMA IPNs have been determined from the DMTA data (E 0 and tan d) and compared with the values calculated with different mechanical models in order to estimate the phase morphology in the material. At 25 C, the Poisson coefficients of PIB and PCHMA are equal to 0.5 [11] and 0.33, respectively (the PCHMA coefficient being supposed equal to that of PMMA [35]). The Poisson coefficient of IPNs is calculated as the weight average of those of both components.…”

Section: Pib/pchma Ipnsmentioning

confidence: 99%