International Technical Digest on Electron Devices Meeting 1992
DOI: 10.1109/iedm.1992.307379
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Nanometer scale thin-film-edge emitter devices with high current density characteristics

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Cited by 9 publications
(2 citation statements)
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“…LGaN (4) where Wd is the depletion layer width and h~f l is the scattering length. The assumption is that once the has collided with a phonon, it cannot be emitted.…”
Section: A L = E X P [ --] W Dmentioning
confidence: 99%
See 1 more Smart Citation
“…LGaN (4) where Wd is the depletion layer width and h~f l is the scattering length. The assumption is that once the has collided with a phonon, it cannot be emitted.…”
Section: A L = E X P [ --] W Dmentioning
confidence: 99%
“…Recent developments in vacuum microelectronics have led to a resurgence of interest in cold cathode electron emission for applications to a variety of electronic devices [1,2,3,4]. The devices include microwave vacuum transistors and tubes [ 1,5], cathodoluminescent flat panel displays [6,7], magnetic sensors[8], lasers [9], pressure sensors[ 101, high temperature and radiation hardened electron devices.…”
Section: Introductionmentioning
confidence: 99%