Nanosatellites in LEO and beyond: Advanced Radiation protection techniques for COTS-based spacecraft

Selčan, David; Kirbiš, Gregor; Kramberger, Iztok

doi:10.1016/j.actaastro.2016.11.032

Cited by 20 publications

(6 citation statements)

References 21 publications

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“…These particles can cause damage to a spacecraft in terms of [33] Typically, shielding is used to reduce components exposure to this radiation. However, the shielding at CubeSats is very limited due to their size and weight restrictions [34]. Electronics COTS components were tested in [35] and it was shown that some of them were able to survive up to 20-30 krad.…”

Section: Space Radiationmentioning

confidence: 99%

A Review of Battery Technology in CubeSats and Small Satellite Solutions

2020

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CubeSats and small satellite solutions are increasing in popularity as they enable a fast, cheap, and agile way for satellite applications. An essential component of nearly every satellite is the energy storage device, which is practically equal to a battery. Consequently, an overview of past, present, and future battery technologies for CubeSats is presented. CubeSats use typically commercial off-the-shelf (COTS) batteries. They are not primarily dedicated to space, so their suitability to the space environment needs to be evaluated. Batteries are also considered as potentially dangerous goods. Thus, there are guidelines and standards that specify safety criteria and tests for the batteries in order to be allowed for transportation and launch. Furthermore, the character of satellites’ missions determines their demand on batteries in terms of current rates, depth-of-discharge, and lifetime. Thus, these expectations are discussed. A market survey was also carried out to identify currently available commercial battery solutions and their parameters. This work summarizes the status, requirements, and the market situation of batteries for CubeSats.

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Section: Space Radiationmentioning

confidence: 99%

A Review of Battery Technology in CubeSats and Small Satellite Solutions

2020

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“…Extremely low and high temperature and high levels of cosmic ray and radiation lead to catastrophic damage to the electronic systems without proper shielding packages. Unfortunately, it is well-known that MOSFETs, which are the most widely used electronic devices, are difficult to use for these applications because they are vulnerable to radiation and temperature [1][2][3][4][5][6][7][8][9][10][11]. Even if state-of-the-art shielding methods can protect MOSFETs from harsh environments, the following issues still remain: large volume, large weight, high power consumption, and complex system design.…”

Section: Introductionmentioning

confidence: 99%

Negative Capacitance Vacuum Channel Transistors for Low Operating Voltage

Choi

2020

Micromachines

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This study proposes negative capacitance vacuum channel transistors. The proposed negative capacitance vacuum channel transistors in which a ferroelectric capacitor is connected in series to the gate of the vacuum channel transistors have the following two advantages: first, adding a ferroelectric capacitor in series with a gate capacitor makes the turn-on voltage lower and on–off transition steeper without causing hysteresis effects. Second, the capacitance matching between a ferroelectric capacitor and a vacuum channel transistor becomes simplified because the capacitance of a vacuum channel transistor as seen from a ferroelectric capacitor is constant.

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“…Moreover, latch-up and functional interrupt phenomena were common, especially in the heavy-ion tests. The single event effect results for the 16 nm FinFET process were significant, and some radiation tolerance strategies were required in a radiation environment.of commercial-off-the-shelf (COTS) in the field of integrated circuits (IC) have enabled the use of inexpensive and high-performance electronic components that also contributes to the space industry [9].As reported in Reference [9,10], in CubeSats or many commercial missions, using COTS components is becoming the rule rather than an exception, and many COTS are complicated systems. However, to reduce risks in the radiation environment, identifying the sensitive and the essential modules for a hardening designer is necessary.…”

mentioning

confidence: 99%

“…of commercial-off-the-shelf (COTS) in the field of integrated circuits (IC) have enabled the use of inexpensive and high-performance electronic components that also contributes to the space industry [9].…”

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confidence: 99%

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SEE Sensitivity Evaluation for Commercial 16 nm SRAM-FPGA

et al. 2019

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Radiation effects can induce severe and diverse soft errors in digital circuits and systems. A Xilinx commercial 16 nm FinFET static random-access memory (SRAM)-based field-programmable gate array (FPGA) was selected to evaluate the radiation sensitivity and promote the space application of FinFET ultra large-scale integrated circuits (ULSI). Picosecond pulsed laser and high energy heavy ions were employed for irradiation. Before the tests, SRAM-based configure RAMs (CRAMs) were initialized and configured. The 100% embedded block RAMs (BRAMs) were utilized based on the Vivado implementation of the compiled hardware description language. No hard error was observed in both the laser and heavy-ion test. The thresholds for laser-induced single event upset (SEU) werẽ 3.5 nJ, and the SEU cross-sections were correlated positively to the laser's energy. Multi-bit upsets were measured in heavy-ion and high-energy laser irradiation. Moreover, latch-up and functional interrupt phenomena were common, especially in the heavy-ion tests. The single event effect results for the 16 nm FinFET process were significant, and some radiation tolerance strategies were required in a radiation environment.of commercial-off-the-shelf (COTS) in the field of integrated circuits (IC) have enabled the use of inexpensive and high-performance electronic components that also contributes to the space industry [9].As reported in Reference [9,10], in CubeSats or many commercial missions, using COTS components is becoming the rule rather than an exception, and many COTS are complicated systems. However, to reduce risks in the radiation environment, identifying the sensitive and the essential modules for a hardening designer is necessary. The Xilinx Ultrascale + FPGA has excellent performance and large storage capacity and it is hugely appealing in data handling. However, the SEU influence and FPGA response are more complicated due to their small feature size, high performance, and special charge collection mechanisms in a radiation environment [3]. Apart from the fault injection in the designing procedure, the irradiation results are more direct and effective to characterize the sensitivity of FPGA. Though several details about alpha particles, neutrons, and protons were reported, the heavy-ion and laser irradiation results are very limited for the CRAM and BRAM module in Ultrascale + FPGA. Moreover, systematic SEE results are essential for the module's potential applications in the radiation environment [11]. Further, FPGA irradiation data will have a guiding significance for logic protections in the design flow and utilization of error mitigation strategies at a system level [1,3].The paper is organized as follows: The device under test (DUT) and testing methods are provided in Section 2. We describe the irradiation parameters and experimental details in Section 3. The heavy-ion and pulse laser irradiation results are presented in Section 4 and further discussion about the application and error mitigation strategies are shown in Section 5. Finally,...

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Nanosatellites in LEO and beyond: Advanced Radiation protection techniques for COTS-based spacecraft

Cited by 20 publications

References 21 publications

A Review of Battery Technology in CubeSats and Small Satellite Solutions

A Review of Battery Technology in CubeSats and Small Satellite Solutions

Negative Capacitance Vacuum Channel Transistors for Low Operating Voltage

SEE Sensitivity Evaluation for Commercial 16 nm SRAM-FPGA

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