2008
DOI: 10.1016/j.tsf.2007.12.159
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Nanoscale investigation of long-term native oxidation of Cu films

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Cited by 52 publications
(36 citation statements)
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“…The oxidation of the formed Cu 2 O film to a CuO film is kinetically limited by the oxygen diffusion through the thin (∼1 nm) CuO surface oxide layer . The CuO layer is too thin to be detected by the XRD, but it is generally agreed that this layer is always present under ambient conditions …”
Section: Influence Of the Reducing Agentsupporting
confidence: 90%
See 1 more Smart Citation
“…The oxidation of the formed Cu 2 O film to a CuO film is kinetically limited by the oxygen diffusion through the thin (∼1 nm) CuO surface oxide layer . The CuO layer is too thin to be detected by the XRD, but it is generally agreed that this layer is always present under ambient conditions …”
Section: Influence Of the Reducing Agentsupporting
confidence: 90%
“…[55,56] The CuO layer is too thin to be detected by the XRD, but it is generally agreed that this layer is always present under ambient conditions. [55][56][57][58] 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57…”
Section: Role Of the Reducing Agent And Choice Of Alternativesmentioning
confidence: 99%
“…4 indicate similar amount of oxygen content at surfaces (∼45 at.%). The high oxygen content at all sample's surfaces could be caused by exposure of samples in air before the analyses [26][27][28]. Based on (a) all samples have native Cu oxide(s) formed at the surfaces, (b) the sheet resistance ( Fig.…”
Section: Resultsmentioning
confidence: 99%
“…However, an apparent difficulty with copper is the oxidation of the metal surface [4]. The oxidation of Cu proceeds rapidly even at minimal oxygen partial pressure [20][21][22]. The crucial issue is not only oxidation of the substrate surface, but also diffusion of copper into the other layers [23].…”
Section: Introductionmentioning
confidence: 99%