2016
DOI: 10.1021/acsnano.5b06893
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Nanoscale Mapping of Dielectric Properties of Nanomaterials from Kilohertz to Megahertz Using Ultrasmall Cantilevers

Abstract: Electrostatic force microscopy (EFM) is often used for nanoscale dielectric spectroscopy, the measurement of local dielectric properties of materials as a function of frequency. However, the frequency range of atomic force microscopy (AFM)-based dielectric spectroscopy has been limited to a few kilohertz by the resonance frequency and noise of soft microcantilevers used for this purpose. Here, we boost the frequency range of local dielectric spectroscopy by 3 orders of magnitude from a few kilohertz to a few m… Show more

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Cited by 33 publications
(20 citation statements)
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“…Labardi proposed an extended model of the interaction between EFM probe tip and thin dielectric film on a conductive substrate, in which higher accurate dielectric permittivity was obtained by single-frequency measurements [18]. Taking the advantage of the high resonant frequency and low thermal noise of a subminiature cantilever beam, cantilever dynamics is correlated to the complex dielectric functions of nanoscale dielectrics at a frequency approaching to a few MHz [19]. In addition to extending the dielectric spectral range of atomic force microscopy (AFM), the method can also identify the electrostatic excitation frequency, thereby providing a higher dielectric contrast for characterizing nanomaterials.…”
Section: Introductionmentioning
confidence: 99%
“…Labardi proposed an extended model of the interaction between EFM probe tip and thin dielectric film on a conductive substrate, in which higher accurate dielectric permittivity was obtained by single-frequency measurements [18]. Taking the advantage of the high resonant frequency and low thermal noise of a subminiature cantilever beam, cantilever dynamics is correlated to the complex dielectric functions of nanoscale dielectrics at a frequency approaching to a few MHz [19]. In addition to extending the dielectric spectral range of atomic force microscopy (AFM), the method can also identify the electrostatic excitation frequency, thereby providing a higher dielectric contrast for characterizing nanomaterials.…”
Section: Introductionmentioning
confidence: 99%
“…CNT distribution characterization of the prepared SWCNT/PI nanocomposite samples was achieved by means of 2 ω e ‐EFM [ 35–37 ] implemented on an Asylum Research MFP‐3D‐BIO atomic force microscope while using a conductive cantilever (AC240TM‐Olympus) with a spring constant k = 1.98 N m −1 and resonance frequency ω 0 = 75.98 kHz. The 2 ω e ‐EFM technique permits the detection of subsurface CNTs in the capacitance gradient ( ∂C/∂z ) maps of SWCNT/PI samples, as similarly reported for several electrical‐based AFM techniques.…”
Section: Methodsmentioning
confidence: 99%
“…Nanomaterials are explorable in the field of EM and RF studies. The nanoscale mapping is possible, and dielectric values of nanomaterials can be derived over the frequency of kilohertz to megahertz . The properties of nanomaterials based on frequency pave the way for its application in EM and RF design.…”
Section: Sar Reduction Methods Based On Shield Materialsmentioning
confidence: 99%