2020
DOI: 10.1016/j.diamond.2020.107969
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Nanoscale profiling of multilayer graphene films on silicon carbide by a focused ion beam

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Cited by 4 publications
(2 citation statements)
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“…A novel correlation was observed between the 2D mode line width and the inverse I D /I G ratio, which allowed the determination of strain type and layer number [ 74 ]. Kolomiytsev et al employ Raman spectroscopy to investigate the layer numbers of multilayer graphene, and found that there were 10 layers per multilayer graphene flake [ 75 ]. Yitzhak et al studied fluctuations in Raman spectra for FLG and single-layer graphene and analyzed the positions and intensities of the Raman peaks for different layer numbers [ 76 ].…”
Section: Techniques Used To Determine Numbers Of Graphene Layersmentioning
confidence: 99%
“…A novel correlation was observed between the 2D mode line width and the inverse I D /I G ratio, which allowed the determination of strain type and layer number [ 74 ]. Kolomiytsev et al employ Raman spectroscopy to investigate the layer numbers of multilayer graphene, and found that there were 10 layers per multilayer graphene flake [ 75 ]. Yitzhak et al studied fluctuations in Raman spectra for FLG and single-layer graphene and analyzed the positions and intensities of the Raman peaks for different layer numbers [ 76 ].…”
Section: Techniques Used To Determine Numbers Of Graphene Layersmentioning
confidence: 99%
“…The G-band Raman peak is related to the sp 2 vibration of carbon that is neatly arranged in the graphene structure. The G-band peak intensity can be used as a reference to compare with the 2Dband peak [26,27]. By comparing the 2D-band peak intensity with the G-band peak intensity (I2D/IG), an indication of the number of graphene layers formed will be obtained.…”
Section: Raman Spectroscopic Characterizationmentioning
confidence: 99%