Nanoscale scratch resistance of ultrathin protective overcoats on hard magnetic disks

Anoikin, E.V.; Yang, Ming-Min; Chao, J.; Elings, J. R.; Brown, Don W.

doi:10.1116/1.581294

Cited by 28 publications

(5 citation statements)

References 4 publications

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“…In all cases, the deposited coatings are amorphous, containing hydrogen to saturate the dangling carbon bonds and to prevent oxidation, and containing nitrogen to improve the overcoat durability [1]. Recently, we have proposed the use of an alternative nanostructured carbon-based coating [2].…”

Section: Introductionmentioning

confidence: 99%

Water adsorption on fullerene-like carbon nitride overcoats

et al. 2008

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Section: Introductionmentioning

confidence: 99%

Water adsorption on fullerene-like carbon nitride overcoats

et al. 2008

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“…1 For example, both AFM and DSI have been used to measure mechanical properties, such as hardness and elastic modulus, of materials using nanoscale indentation [2][3][4] and to investigate the scratch resistance of diamond-like carbon coatings using nanoscale scratch and wear testing techniques. [5][6][7][8] However, only in a few instances 3,9 has the indentation and scratch behavior of polymeric materials been studied with submicrometer spatial resolution.…”

Section: Introductionmentioning

confidence: 99%

“…[5][6][7][8] In general during an AFM scratch test, the probe tip moves toward the sample, contacts and penetrates into the sample surface, moves laterally across the sample, and then lifts off of the sample surface. Concurrently, deflection of the cantilever probe is measured, often by using an optical lever system.…”

Section: Introductionmentioning

confidence: 99%

Direct measurement of plowing friction and wear of a polymer thin film using the atomic force microscope

VanLandingham

Zhang

et al. 2001

J. Mater. Res.

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Nanometer-scale plowing friction and wear of a polycarbonate thin film were directly measured using an atomic force microscope (AFM) with nanoscratching capabilities. During the nanoscratch tests, lateral forces caused discrepancies between the maximum forces for the initial loading prior to the scratch and the unloading after the scratch. In the case of a nanoscratch test performed parallel to the cantilever probe axis, the plowing friction added another component to the moment acting at the cantilevered end compared to the case of nanoindentation, resulting in an increased deflection of the cantilever. Using free-body diagrams for the cases of nanoindentation and nanoscratch testing, the AFM force curves were analyzed to determine the plowing friction during nanoscratch testing. From the results of this analysis, the plowing friction was found to be proportional to the applied contact force, and the coefficient of plowing friction was measured to be 0.56 ± 0.02. Also, by the combination of nanoscratch and nanoindentation testing, the energetic wear rate of the polycarbonate thin film was measured to be 0.94 ± 0.05 mm 3 /(N m).

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“…There have been a number of approaches geared to the use of SPM-based techniques in lithographic applications. One of the earlier examples was based on the use of an SPM tip for “scratching” a surface thereby generating a pattern. − This was done initially on bare surfaces and afterward on surfaces modified with organic layers. − Although the principle was clearly demonstrated, these techniques suffered from numerous drawbacks including wide variability and the fact that the tip could be easily damaged and/or modified giving rise to unpredictable and uncontrolled variations in the patterns generated. , Avouris and co-workers also demonstrated the ability to use AFM to induce the oxidation of Si wafers, thus generating patterns by the selective etching of the oxide. , The use of electrodeposition with SPM probes for lithographic applications has also been demonstrated − This approach offers great resolution and control, and in addition, both the tip and the substrate can be active elements in the process.…”

Section: Introductionmentioning

confidence: 99%

Lithographic Applications of Redox Probe Microscopy

et al. 2001

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The molecular-scale lithographic applications of a technique which we have developed and termed redox probe microscopy, RPM, in which an AFM tip is modified with redox-active materials, are presented. In this technique, the interactions between the tip and an adsorbate or between the tip and a surface are modulated by means of the electrode potential, allowing for the generation of desired surface structures and patterns. Two cases are presented: (a) the use of an RPM tip to deliberately manipulate and position objects (“microtweezers”) and (b) the utilization of an RPM tip to “pattern” a pH-sensitive block copolymer using what we term the “pH-stylus”. In the first case, the AFM tip is modified with a film of poly(vinylferrocene) and the adhesive interactions of the modified tip with sulfonated chromatography beads are deliberately controlled to be either strong or weak depending on the redox state of the ferrocene centers, allowing for the deliberate positioning of the beads to generate a pattern. In the pH-stylus, an RPM tip is modified with a hydroquinone self-assembling monolayer which upon oxidation releases protons. By a scan of such a modified tip over a pH-sensitive block copolymer and control of the electrode potential, the polymer film can be exposed to generate patterns.

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Nanoscale scratch resistance of ultrathin protective overcoats on hard magnetic disks

Cited by 28 publications

References 4 publications

Water adsorption on fullerene-like carbon nitride overcoats

Water adsorption on fullerene-like carbon nitride overcoats

Direct measurement of plowing friction and wear of a polymer thin film using the atomic force microscope

Lithographic Applications of Redox Probe Microscopy

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