Nanosecond electron microscopes

Bostanjoglo, O.; Elschner, Robert; Mao, Zugang; Nink, T.; Weingärtner, M.

doi:10.1016/s0304-3991(99)00180-1

Cited by 69 publications

(36 citation statements)

References 15 publications

Supporting

Mentioning

Contrasting

Unclassified

Order By: Relevance

“…In contrast, the single shot imaging method described here, while also following the developments of Bostanjoglo [4,[18][19][20][21][22][23], acquires an electron micrograph with a single pulse of electrons [24]. The requirement of image formation with a single pulse of electrons places stringent conditions on the electron emission and is controlled, as is usual in electron microscopy, by the brightness of the source [25].…”

Section: Introductionmentioning

confidence: 99%

Quantifying transient states in materials with the dynamic transmission electron microscope

Campbell

LaGrange

Kim

et al. 2010

Journal of Electron Microscopy

View full text Add to dashboard Cite

(250 words)The Dynamic Transmission Electron Microscope (DTEM) offers a means of capturing rapid evolution in a specimen through in-situ microscopy experiments by allowing 15 ns electron micrograph exposure times. The rapid exposure time is enabled by creating a burst of electrons at the emitter by ultraviolet pulsed laser illumination. This burst arrives a specified time after a second laser initiates the specimen reaction. The timing of the two Q-switched lasers is controlled by highspeed pulse generators with a timing error much less than the pulse duration. Both diffraction and imaging experiments can be performed, just as in a conventional TEM. The brightness of the emitter and the total current control the spatial and temporal resolutions. We have demonstrated 7 nm spatial resolution in single 15 ns pulsed images. These single-pulse imaging experiments have been used to study martensitic transformations, nucleation and crystallization of an amorphous metal, and rapid chemical reactions. Measurements have been performed on these systems that are possible by no other experimental approaches currently available.2

show abstract

Section: Introductionmentioning

confidence: 99%

Quantifying transient states in materials with the dynamic transmission electron microscope

Campbell

LaGrange

Kim

et al. 2010

Journal of Electron Microscopy

View full text Add to dashboard Cite

show abstract

“…In addition to the previously described work of Bostanjoglo,28,197,198 Zewail and co-workers, 172,[185][186][187]234 the LLNL DTEM project, 29,30,[193][194][195][196] and the work that is currently underway at UC-Davis (which is being transferred to PNNL in 2012), there are projects that are building new microscopes in Japan, Switzerland, Germany and Russia. There is also a large-scale project for the development of DTEM being initiated in Canada.…”

Section: The Significance Of Single-shot Utem In the Global Research mentioning

confidence: 99%

“…This design path has actually been followed by all the previous single shot instruments that have been constructed. As shown in Figure 38, the initial work on single-shot imaging was performed by Bostanjoglo et al 28,197 using a Siemens Elmiskop (a 1950's vintage TEM). The next generation instrument built at LLNL, moved to more modern lens systems (lower aberrations) in a JEOL 2000 FX microscope (a 1970's vintage TEM).…”

Section: The Columnmentioning

confidence: 99%

“…28,197,198 The single shot approach means that the process being studied need not be perfectly reversible as all the information is obtained from a single specimen drive event. However, the limitation to this method is that space-charge effects in the beam can lead to degradation of resolution and even with an optimized microscope source, column, and detector the high current will limit the overall temporal and spatial resolution of the instrument.…”

Section: Two Contrasting Modes Of Operation: Stroboscopic and Single mentioning

confidence: 99%

See 1 more Smart Citation

Dynamic Processes in Biology, Chemistry, and Materials Science: Opportunities for UltraFast Transmission Electron Microscopy - Workshop Summary Report

Kabius¹,

Browning²,

Thevuthasan³

et al. 2012

View full text Add to dashboard Cite

This report summarizes a 2011 workshop held at the Environmental Molecular Sciences Laboratory (EMSL) in Richland, Washington, that addressed the potential role of rapid, time-resolved electron microscopy measurements in accelerating the solution of important scientific and technical problems. A series of U.S. Department of Energy (DOE) and National Academy of Science workshops have highlighted the critical role advanced research tools play in addressing scientific challenges relevant to biology, sustainable energy, and technologies that will fuel economic development without degrading our environment. Among the specific capability needs for advancing science and technology are tools that extract more detailed information in realistic environments (in situ or operando) at extreme conditions (pressure and temperature) and as a function of time (dynamic and time-dependent). One of the DOE workshops, "Future Science Needs and Opportunities for Electron Scattering: Next Generation Instrumentation and Beyond," specifically addressed the importance of electron-based characterization methods for a wide range of energy-relevant Grand Scientific Challenges. Boosted by the electron optical advancement in the last decade, a diversity of in situ capabilities already is available in many laboratories. These capabilities enable the investigations of biological and chemical processes in situ with the high spatial and spectroscopic resolution provided by transmission electron microscopy (TEM). The remaining major capability gap is the lack of time resolution. State-of-the-art in situ TEM instrumentation allows time resolution of seconds or milliseconds at best. Present capabilities are far removed from the natural time scale on which processes on a microscopic level occur which is between microseconds (µs) to attoseconds (as).In an effort to address current capability gaps, EMSL, with support from FCSD, the Fundamental & Computational Sciences Directorate at PNNL, organized an "Ultrafast Electron Microscopy Workshop," held June 14-15, 2011, with the primary goal to identify the scientific needs that could be met by creating a facility capable of a strongly improved time resolution with integrated in situ capabilities. The workshop brought together more than 40 leading scientists involved in applying and/or advancing electron microscopy to address important scientific problems of relevance to DOE's research mission. This workshop built on previous workshops 1 and included three breakout sessions identifying scientific challenges in biology, biogeochemistry, catalysis, and materials science-frontier areas of fundamental science that underpin energy and environmental science-that would significantly benefit from ultrafast transmission electron microscopy. In addition, the current status of time-resolved electron microscopy was examined, and the technologies that will enable future advances in spatio-temporal resolution were identified in a fourth breakout session.The major conclusion of the workshop was that significant scientific...

show abstract

“…To achieve this temporal resolution while still maintaining the direct high resolution imaging capability of a TEM, required the modification of a conventional TEM to create and control large electron bunches (containing ~10 9 electrons) -this development follows the groundbreaking research of Bostanjoglo and co-workers in this area [31][32][33]. In this paper, the basic physical principles behind the creation of electron bunches, their control and the expected TEM image resolution are defined.…”

Section: Introductionmentioning

confidence: 99%

Recent developments in dynamic transmission electron microscopy

Browning

Bonds

Campbell

et al. 2012

Current Opinion in Solid State and Materials Science

View full text Add to dashboard Cite

One of the current major driving forces behind instrument development in transmission electron microscopy (TEM) is the ability to observe materials processes as they occur in-situ within the microscope. For many processes, such as nucleation and growth, phase transformations and mechanical response under extreme conditions, the beam current in even the most advanced field emission TEM is insufficient to acquire images with the temporal resolution (~1s -1ns) needed to observe the fundamental interactions taking place. The dynamic transmission electron microscope (DTEM) avoids this problem by using a short pulse laser to create an electron pulse of the required duration through photoemission which contains enough electrons to form a complete high resolution image. The current state-of-theart in high time resolution electron microscopy in this paper describes the development of the electron optics and detection schemes necessary to fully utilize these electron pulses for materials science. In addition, developments for future instrumentation and the experiments that are expected to be realized shortly will also be discussed.

show abstract

Nanosecond electron microscopes

Cited by 69 publications

References 15 publications

Quantifying transient states in materials with the dynamic transmission electron microscope

Quantifying transient states in materials with the dynamic transmission electron microscope

Dynamic Processes in Biology, Chemistry, and Materials Science: Opportunities for UltraFast Transmission Electron Microscopy - Workshop Summary Report

Recent developments in dynamic transmission electron microscopy

Contact Info

Product

Resources

About