2001
DOI: 10.1088/0022-3727/34/20/303
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Nanosecond pulsed field magnetization reversal in thin-film NiFe studied by Kerr effect magnetometry

Abstract: Magnetization reversal has been studied in a 5 nm thick Ni80Fe20 film under the action of a pulsed magnetic field, for pulse durations between 2-102 ns. Fast pulses were applied to the sample from a thin-film microstrip transmission line and magnetization changes were measured using a continuous wave laser magneto-optic Kerr effect magnetometer. The switching field was found to increase as the pulse duration decreased, in qualitative agreement with simple models. More unusually, the switching field was also fo… Show more

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Cited by 8 publications
(2 citation statements)
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“…The measurements were made using either a pulsed field or a swept field to precipitate the magnetization reversal. Squares: swept field, NiFe, [20]; circles: pulsed field, NiFe, [21][22][23][24]; upright triangles: swept field, Fe, [25]; inverted triangles: swept field, Co, [17]. The solid curve corresponds to the field H prec necessary to switch a magnetic moment by precession on the timescale of t exp .…”
Section: Figurementioning
confidence: 99%
“…The measurements were made using either a pulsed field or a swept field to precipitate the magnetization reversal. Squares: swept field, NiFe, [20]; circles: pulsed field, NiFe, [21][22][23][24]; upright triangles: swept field, Fe, [25]; inverted triangles: swept field, Co, [17]. The solid curve corresponds to the field H prec necessary to switch a magnetic moment by precession on the timescale of t exp .…”
Section: Figurementioning
confidence: 99%
“…Wire widths ranged from 800 nm down to 200 nm and the wire length was 50 mm. A further level of fabrication produced 30 mm wide microstrip line conductors of 30 nm thick aluminium overlapping one end of each wire (a copper ground plane was added to the base of the substrate to complete the transmission line [4]). …”
mentioning
confidence: 99%