1999
DOI: 10.1007/s003390051520
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Nanosecond UV laser damage and ablation from fluoride crystals polished by different techniques

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Cited by 31 publications
(6 citation statements)
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“…In the process of irradiation damage, impurity ions reduce the F-H pair formation energy and stabilize the F center and H center. This behavior has been confirmed by various experimental data and calculation results [3,5,11,13] . In order to understand accurately the effect of Y ions on the damage during irradiation, the absorption coefficient was used in this work to assess the damage degree.…”
Section: Irradiation-induced Color Centers Analysissupporting
confidence: 73%
See 1 more Smart Citation
“…In the process of irradiation damage, impurity ions reduce the F-H pair formation energy and stabilize the F center and H center. This behavior has been confirmed by various experimental data and calculation results [3,5,11,13] . In order to understand accurately the effect of Y ions on the damage during irradiation, the absorption coefficient was used in this work to assess the damage degree.…”
Section: Irradiation-induced Color Centers Analysissupporting
confidence: 73%
“…Although the transmittance of CaF2 crystal meets the 193 nm lithography requirements, even when the laser energy density is below the damage threshold, they cannot avoid the optical damage caused by cumu-lative ultraviolet radiation. This behavior is known as the incubation effect [1][2][3][4] . To improve the resistance of CaF2 to DUV laser irradiation, investigating the interaction between the DUV laser and CaF2 and clarifying the mechanism of laser damage is very important.…”
mentioning
confidence: 99%
“…As examples, we mention fluoride surfaces gaining tremendous importance for ultraviolet optical components and oxide surfaces that are widely used as supports for catalysts. Surface structure and defects strongly influence optical performance and radiation stability of the former [1], while they determine nucleation, growth and stability of catalytically active particles for the latter [2]. The only direct analytical technique allowing surface analysis of insulators on the atomic scale available to date is scanning force microscopy (SFM) operated in the dynamic mode [3].…”
Section: Introductionmentioning
confidence: 99%
“…48 In their following work, they used photoacoustic mirage technique to determine the ablation threshold of different optical materials such as CaF2, BaF2, MgF2 and LiF with different polishing techniques. 49 In all the above examples, the laser energy densities were much higher than those used in the present work, resulting in ablation of the substrate itself.…”
Section: Adsorbate Surface Analysismentioning
confidence: 70%