2022
DOI: 10.3390/cryst12081033
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Narrowband Near-Infrared Perovskite/Organic Photodetector: TCAD Numerical Simulation

Abstract: Narrowband photodetectors (PD) established in the near-infrared (NIR) wavelength range are highly required in a variety of applications including high-quality bioimaging. In this simulation study, we propose a filter-less narrowband PD based on the architecture of perovskite/organic heterojunction. The most decisive part of the photodetector is the hierarchical configuration of a larger bandgap perovskite material with a thicker film followed by a lower bandgap organic material with a narrower layer. The desig… Show more

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Cited by 6 publications
(2 citation statements)
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“…To shed further light on the underlying reason for the unusual photoresponse, the 2D optoelectronic simulator, Luminous of Silvaco Technology Computer-Aided Design (TCAD), was used to simulate the optical property of a GaAs thin-film device under illumination at different wavelengths. , The photon absorption of GaAs crystals corresponding to different incident wavelengths is shown in Figure a, from which a significant difference in photoabsorption rate is observed at different depths. Figure b shows the same plot, enlarged up to 80 nm in depth.…”
Section: Resultsmentioning
confidence: 99%
“…To shed further light on the underlying reason for the unusual photoresponse, the 2D optoelectronic simulator, Luminous of Silvaco Technology Computer-Aided Design (TCAD), was used to simulate the optical property of a GaAs thin-film device under illumination at different wavelengths. , The photon absorption of GaAs crystals corresponding to different incident wavelengths is shown in Figure a, from which a significant difference in photoabsorption rate is observed at different depths. Figure b shows the same plot, enlarged up to 80 nm in depth.…”
Section: Resultsmentioning
confidence: 99%
“…The lowest unoccupied molecular orbital (LUMO) and the highest occupied molecular orbital (HOMO) energy levels of CD1 and PBN-21 are measured by cyclic voltammetry, while the electron and hole mobilities were determined by the space-charge limited current method [20]. Other parameters are fitted or extracted from the literature [34,35]. Additionally, Table 2 addresses the main bulk and interface defect parameters.…”
Section: Basic Structure and Layer Materialsmentioning
confidence: 99%