2016 IEEE Intl Conference on Computational Science and Engineering (CSE) and IEEE Intl Conference on Embedded and Ubiquitous Co 2016
DOI: 10.1109/cse-euc-dcabes.2016.206
|View full text |Cite
|
Sign up to set email alerts
|

NBTI in FinFET Circuits under the Temperature Effect Inversion

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Year Published

2016
2016
2018
2018

Publication Types

Select...
1
1

Relationship

0
2

Authors

Journals

citations
Cited by 2 publications
references
References 24 publications
0
0
0
Order By: Relevance