In this paper, a new sampling scheme of the near field radiated by a
planar source is proposed and assessed. More in detail, the paper shows
a uniform sampling criterion that allows representing the near field
over a plane with a number of measurements lower than the classical
half-wavelength sampling. At first, a discretization strategy of the
near field based on the warping method is recalled from the literature.
The latter requires to collect a non-redundant number of field
measurements that are non-uniformly arranged over the observation
domain. Despite this, the warping sampling scheme works well only if the
measurement plane does not overcome the source. When the observation
domain is larger, it does not predict the exact positions of the field
samples at the edges of the measurement plane; accordingly, in these
regions it is not possible to recover the near field behavior by the
collected samples. To overcome this drawback, a spatially varying
oversampling is exploited. The latter is chosen in such a way that the
resulting sampling becomes uniform. Such choice also ensures a growth of
the sampling rate only at the edges of the observation domain permitting
the retrieval of the near field by its samples. Finally, numerical
simulations based on experimental data corroborate the effectiveness of
the approach in recovering both the near and the far field.