2005
DOI: 10.1002/smll.200500256
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Near‐Edge X‐ray Absorption Fine Structure Spectroscopy as a Tool for Investigating Nanomaterials

Abstract: We have demonstrated near-edge X-ray absorption fine structure (NEXAFS) spectroscopy as a particularly useful and effective technique for simultaneously probing the surface chemistry, surface molecular orientation, degree of order, and electronic structure of carbon nanotubes and related nanomaterials. Specifically, we employ NEXAFS in the study of single-walled carbon nanotube and multi-walled carbon nanotube powders, films, and arrays, as well as of boron nitride nanotubes. We have focused on the advantages … Show more

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Cited by 162 publications
(152 citation statements)
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“…The dependence of the intensity of the detected spectral features on the orientation of the final state orbital with respect to the electric field vector of the incident photon beam 58 also allows the surface molecular orientation of nanomaterials [59][60][61] and adsorbates 62 to be investigated.…”
Section: Introductionmentioning
confidence: 99%
“…The dependence of the intensity of the detected spectral features on the orientation of the final state orbital with respect to the electric field vector of the incident photon beam 58 also allows the surface molecular orientation of nanomaterials [59][60][61] and adsorbates 62 to be investigated.…”
Section: Introductionmentioning
confidence: 99%
“…In NEXAFS, a plot of the π* intensity in polymers with exposed catechols increases slightly with an increasing incident angle (Fig. 2b), indicating a slightly ordered orientation of aromatic rings on the surface, whereas in polymers with blocked catechols random distribution is evident 25,26 (Fig. 2c).…”
mentioning
confidence: 99%
“…2d), suggesting that removal of the silyl groups may enable more catechols to populate the interface. Given the low uncertainty of the NEXAFS measurements, the differences are likely to be significant 25,26 . Consistent with NEXAFS, X-ray photoelectron spectroscopy showed ∼10% decrease in the Si 2p signal following acid treatment ( Supplementary Fig.…”
mentioning
confidence: 99%
“…Near-edge X-ray absorption spectroscopy (XAS) techniques are well established for characterizing element-specific electronic structure with extremely high surface sensitivity, making it an ideal tool for the study of graphene 11 . The peak positions and lineshapes of the observed XAS resonances represent, to first approximation, a replica of the unoccupied atom-projected density of states modified by core-hole interactions.…”
mentioning
confidence: 99%