2000
DOI: 10.1016/s0257-8972(99)00585-x
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Near-edge X-ray absorption fine structure study of carbon nitride films

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Cited by 8 publications
(2 citation statements)
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“…All three materials show different features in the so-called "pre-edge region" between 286 and 288 eV. Surface chemistry-specific absorption features attributed to C=O bonds at 286.5 eV [39,40] and C-H bonds at ≈287.3 eV [41,42] are present in this region. Both hydrogenated samples show an increase in C-H resonance compared to the oxidized starting material, indicating successful surface modification by both techniques.…”
Section: Nexafs Xps and Ftirmentioning
confidence: 93%
“…All three materials show different features in the so-called "pre-edge region" between 286 and 288 eV. Surface chemistry-specific absorption features attributed to C=O bonds at 286.5 eV [39,40] and C-H bonds at ≈287.3 eV [41,42] are present in this region. Both hydrogenated samples show an increase in C-H resonance compared to the oxidized starting material, indicating successful surface modification by both techniques.…”
Section: Nexafs Xps and Ftirmentioning
confidence: 93%
“…The peak at 286.6 eV is correlated in literature 56,57 with C1s → * ͑C w N͒ resonances, as well as some * resonances from C v O and in some cases with C v N bonding environments. 58 The resonances at 288.2 eV can be correlated with * ͑C-H͒ transitions ͑see Ref. 56͒ and with * ͑C v O͒ originating from amide groups.…”
Section: Nexafs Spectroscopymentioning
confidence: 95%