Near-field measurement of stochastic electromagnetic fields

Russer, Johannes A.; Uddin, Nasir; Awny, A.; Thiede, A.; Russer, P.

doi:10.1109/memc.2015.7336761

Cited by 33 publications

(11 citation statements)

References 24 publications

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“…5 The equivalent circuit model of the loop antenna, required for a simulation of the whole system, is depicted in Figure 1a. We use an approach described in 6 to figure out the serial resistance and inductance of the loop antenna.…”

Section: Loop Antenna As a Spin Wave Sensing Elementmentioning

confidence: 99%

Design of a CMOS integrated on-chip oscilloscope for spin wave characterization

et al. 2017

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Spin waves can perform some optically-inspired computing algorithms, e.g. the Fourier transform, directly than it is done with the CMOS logic. This article describes a new approach for on-chip characterization of spin wave based devices. The readout circuitry for the spin waves is simulated with 65-nm CMOS technology models. Commonly used circuits for Radio Frequency (RF) receivers are implemented to detect a sinusoidal ultra-wideband (5-50 GHz) signal with an amplitude of at least 15 μV picked up by a loop antenna. First, the RF signal is amplified by a Low Noise Amplifier (LNA). Then, it is down-converted by a mixer to Intermediate Frequency (IF). Finally, an Operational Amplifier (OpAmp) brings the IF signal to higher voltages (50-300 mV). The estimated power consumption and the required area of the readout circuit is approximately 55.5 mW and 0.168 mm2, respectively. The proposed On-Chip Oscilloscope (OCO) is highly suitable for on-chip spin wave characterization regarding the frequency, amplitude change and phase information. It offers an integrated low power alternative to current spin wave detecting systems.

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Section: Loop Antenna As a Spin Wave Sensing Elementmentioning

confidence: 99%

Design of a CMOS integrated on-chip oscilloscope for spin wave characterization

et al. 2017

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“…If it is determined correctly, the calibration characteristic is further used to correct the measured output, that is to say, the probe influence would be removed and the final result would correspond to the realistic field that would have existed in the absence of the probe. Successfully calibrated near-field probes are particularly important in recently proposed approaches for an efficient characterization of stochastic EM fields [6][7][8], where two-point measurements for capturing the correlation information should be applied. This procedure may require probes of different diameters depending on which height from a device under test (DUT) the scanning is performed or it may be imposed that the probes are very close to each other due to the required resolution of a scanning plane.…”

Section: Introductionmentioning

confidence: 99%

Calibration of the loop probe for the near-field measurement

Dimitrijević

Atanasković

Doncov

et al. 2020

Int. J. Microw. Wireless Technol.

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Accurate near-field measurements for either deterministic or stochastic electromagnetic fields characterization require a relevant process that removes the influence of the probes, transmission lines, and measurement circuits. The main part of the experimental work presented here is related to a calibration procedure of a test setup consisting of a microstrip test structure and a scanning loop probe. The calibration characteristic, obtained by comparing measured and simulated results, is then used to convert the measured voltage into the magnetic field across and along the microstrip line at the specific height above it. By performing the measurements and simulations of the same test structure with the loop probe in the presence of an additional scanning probe, the influence of the additional probe to the measured output is thoroughly investigated and relevant corrections are given. These corrections can be important when two-point correlation measurement is required, especially in scanning points when two probes are mutually close.

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“…Their characterization requires near field scanning. [28][29][30] The amount of data for a field characterization by correlation information can be enormous. In frequency domain, we need to store the frequency domain auto-and cross-correlation functions for each sampling point and for each pair of sampling points, respectively.…”

Section: Introductionmentioning

confidence: 99%

Principal component analysis for efficient characterization of stochastic electromagnetic fields

Haider

Russer

2017

Int J Numerical Modelling

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The propagation of stochastic electromagnetic fields can be accurately modeled using the auto-and cross-correlation spectra of the field components. In this work, we introduce the framework of principal component analysis for reducing the computational cost of handling stochastic electromagnetic fields described by correlation matrices. We consider noisy electromagnetic fields originating from stationary random processes with Gaussian probability distribution. The amount of data obtained by 2-dimensional near-field measurements and by determining the autoand cross-correlation information of electromagnetic interference can become burdensome for further processing even for problems of moderate size. For obtaining the correlation data, 2 measurement probes have to scan a defined grid of measurement points. For each pair of points, the spatial correlations need to be calculated, and hence, the data obtained scales quadratically with the number of sampling points.To reduce the amount of data, we project the given data obtained by measurement or simulation onto directions of maximum variation, the so called principal components, and keep only those principal components which contribute most to the total variance. In this way, the memory demand for storage and further computation of stochastic electromagnetic fields can be reduced significantly. KEYWORDS electromagnetic interference, noisy electromagnetic fields, principal component analysis, stochastic electromagnetic fields Int J Numer Model. 2018;31:e2246.wileyonlinelibrary.com/journal/jnm

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Near-field measurement of stochastic electromagnetic fields

Cited by 33 publications

References 24 publications

Design of a CMOS integrated on-chip oscilloscope for spin wave characterization

Design of a CMOS integrated on-chip oscilloscope for spin wave characterization

Calibration of the loop probe for the near-field measurement

Principal component analysis for efficient characterization of stochastic electromagnetic fields

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