Near-Field Plasmonic Probe with Super Resolution and High Throughput and Signal-to-Noise Ratio

Jiang, Ruei-Han; Chen, Chi; Lin, Ding‐Zheng; Chou, He-Chun; Chu, Jung‐Lien; Yen, Ta‐Jen

doi:10.1021/acs.nanolett.7b04142

Cited by 52 publications

(32 citation statements)

References 66 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Unlike scattering‐type near‐field systems, near‐field instruments in the early days typically used an aperture probe that functioned as a waveguide and subdiffraction emitter, similar to the original scheme proposed by Synge. Today, aperture‐based SNOM is still a popular technique that offers unique advantages, especially those related to visible or ultraviolet illumination . A detailed review of aperture‐based SNOM (a‐SNOM) can be found in reference .…”

Section: Historical Overviewmentioning

confidence: 99%

Modern Scattering‐Type Scanning Near‐Field Optical Microscopy for Advanced Material Research

et al. 2019

View full text Add to dashboard Cite

IntroductionOver the past decade, optical near-field techniques, especially scattering-type scanning near-field optical microscopy Infrared and optical spectroscopy represents one of the most informative methods in advanced materials research. As an important branch of modern optical techniques that has blossomed in the past decade, scattering-type scanning near-field optical microscopy (s-SNOM) promises deterministic characterization of optical properties over a broad spectral range at the nanoscale. It allows ultrabroadband optical (0.5-3000 µm) nanoimaging, and nanospectroscopy with fine spatial (<10 nm), spectral (<1 cm −1 ), and temporal (<10 fs) resolution. The history of s-SNOM is briefly introduced and recent advances which broaden the horizons of this technique in novel material research are summarized. In particular, this includes the pioneering efforts to study the nanoscale electrodynamic properties of plasmonic metamaterials, strongly correlated quantum materials, and polaritonic systems at room or cryogenic temperatures. Technical details, theoretical modeling, and new experimental methods are also discussed extensively, aiming to identify clear technology trends and unsolved challenges in this exciting field of research. and Astronomy. His research interests cover nanoscale and ultrafast electromagnetic responses of strongly correlated electron materials, 2D materials, and metamaterials that span from the near-infrared to terahertz frequencies.tip-sample interactions. In s-SNOM, these difficulties result from at least three factors. First, the well-known antenna effect [48] causes light to be highly confined between the probe apex and the sample surface. The specific geometry of the tip shank plays a significant role in determining the intensity of the scattered signal. [49] Second, in addition to the local optical information, a strong but undesired background signal can be detected. This background signal can be mainly attributed to the light scattering from the tip shank, cantilever, and sample surface. Third, due to the broad momentum distribution of the localized radiation, in some cases, nominally "far-field trivial" Adv. Mater. 2019, 31, 1804774 Figure 1. Far-field (blue) and near-field (yellow) measurements, accessing the propagating field and the evanescent field, respectively.The authors declare no conflict of interest.

show abstract

Section: Historical Overviewmentioning

confidence: 99%

Modern Scattering‐Type Scanning Near‐Field Optical Microscopy for Advanced Material Research

et al. 2019

View full text Add to dashboard Cite

show abstract

“…Both AFM and NSOM methods are crucial for many fields of science, technology, and industry, and are usually used separately [3][4][5]. These complementary methods are widely used for nanoscale study and characterization of new nanomaterial components, life science and biological objects [6], semiconductor and electronic metrology, and in photonics and plasmonics [7]. Several NSOM techniques have been proposed, such as differential NSOM [8], active-tip NSOM [9,10], and more.…”

Section: Surface Scanning Background and Needsmentioning

confidence: 99%

Advanced Surface Probing Using a Dual-Mode NSOM–AFM Silicon-Based Photosensor

et al. 2019

View full text Add to dashboard Cite

A feasibility analysis is performed for the development and integration of a near-field scanning optical microscope (NSOM) tip–photodetector operating in the visible wavelength domain of an atomic force microscope (AFM) cantilever, involving simulation, processing, and measurement. The new tip–photodetector consists of a platinum–silicon truncated conical photodetector sharing a subwavelength aperture, and processing uses advanced nanotechnology tools on a commercial silicon cantilever. Such a combined device enables a dual-mode usage of both AFM and NSOM measurements when collecting the reflected light directly from the scanned surface, while having a more efficient light collection process. In addition to its quite simple fabrication process, it is demonstrated that the AFM tip on which the photodetector is processed remains operational (i.e., the AFM imaging capability is not altered by the process). The AFM–NSOM capability of the processed tip is presented, and preliminary results show that AFM capability is not significantly affected and there is an improvement in surface characterization in the scanning proof of concept.

show abstract

“…Radially polarized surface plasmon polariton (SPP) waves that are coupled to the shaft of such a taper are nano focused to its apex. The integration of such a plasmonic nanofocusing probe into an atomic force microscope (AFM) [42][43][44]50] or an STM [51,52] can selectively bring this optical excitation to a specific point near the sample surface, making it an effective tool for spatially resolved studies of light-matter interaction at the nanoscale. Most recently [26], such a light source has been used to record local light scattering spectra from single gold nanorods with 5-nm spatial resolution.…”

Section: Introductionmentioning

confidence: 99%

Plasmonic nanofocusing spectral interferometry

et al. 2020

View full text Add to dashboard Cite

We describe and demonstrate a novel experimental approach to measure broadband, amplitude- and phase-resolved scattering spectra of single nanoparticles with 10-nm spatial resolution. Nanofocusing of surface plasmon polaritons (SPPs) propagating along the shaft of a conical gold taper is used to create a spatially isolated, spectrally broad nanoscale light source at its very apex. The interference between these incident SPPs and SPPs that are backpropagating from the apex leads to the formation of an inherently phase-stable interferogram, which we detect in the far field by partially scattering SPPs off a small protrusion on the taper shaft. We show that these interferograms allow the reconstruction of both the amplitude and phase of the local optical near fields around individual nanoparticles optically coupled to the taper apex. We extract local light scattering spectra of particles and quantify line broadenings and spectral shifts induced by tip-sample coupling. Our experimental findings are supported by corresponding finite-difference time-domain and coupled dipole simulations and show that, in the limit of weak tip-sample coupling, the measurements directly probe the projected local density of optical states of the plasmonic system. The combination of a highly stable inline interferometer with the inherent optical background suppression through nanofocusing makes it a promising tool for the locally resolved study of the spectral and temporal optical response of coupled hybrid nanosystems.

show abstract

Near-Field Plasmonic Probe with Super Resolution and High Throughput and Signal-to-Noise Ratio

Cited by 52 publications

References 66 publications

Modern Scattering‐Type Scanning Near‐Field Optical Microscopy for Advanced Material Research

Modern Scattering‐Type Scanning Near‐Field Optical Microscopy for Advanced Material Research

Advanced Surface Probing Using a Dual-Mode NSOM–AFM Silicon-Based Photosensor

Plasmonic nanofocusing spectral interferometry

Contact Info

Product

Resources

About