Near-field scanner for the accurate characterization of electromagnetic fields in the close vicinity of electronic devices and systems

Haelvoet, K.; Criel, S.; Dobbelaere, F.; Martens, Luc; Langhe, P. De; Smedt, R. De

doi:10.1109/imtc.1996.507338

Cited by 19 publications

(10 citation statements)

References 2 publications

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“…The near-fields are not propagating waves and they remain attached to the component. between the components that degrades signal integrity [74][75][76]. When a component is embedded in an anisotropic medium, the near-field changes its shape in a manner that prefers to develop in the directions with the highest constitutive values [76].…”

Section: Spatially Variant Anisotropic Metamaterialsmentioning

confidence: 99%

Spatially variant periodic structures in electromagnetics

Rumpf

Pazos

Digaum

et al. 2015

Phil. Trans. R. Soc. A.

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Section: Spatially Variant Anisotropic Metamaterialsmentioning

confidence: 99%

Spatially variant periodic structures in electromagnetics

Rumpf

Pazos

Digaum

et al. 2015

Phil. Trans. R. Soc. A.

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“…For radio-frequency (RF) fields from tens of MHz up to tens of GHz, various kinds of sensor-scanning systems have been developed to measure RF emissions from electronic devices and systems, individual PCBs, and even onboard VLSI chips. In these systems, for example, an electric field probe (Dutta et al, 1999), a magnetic loop probe (Haelvoet et al, 1996), a magnetic sensor array (Yamaguchi et al, 1999), and an electromagnetic field probe (Kazama and Arai, 2002) have been used with mechanically-scanning systems (Baudry et al, 2007), which have measured and visualized RF near-field distributions. A 2-d dense array of thousands of loop sensors for nearfield distribution imaging (without the need for scanning) has also been available (Fan, 2009).…”

Section: Introductionmentioning

confidence: 99%

In-Situ Measurement and Visualization of Electromagnetic Fields

Ozaki

Sugiura

Yagitani

et al. 2013

Proceedings of the 2nd International Conference on Telecommunications and Remote Sensing

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In-situ monitoring of electromagnetic field distributions is useful for localizing and identifying EM noise sources, as well as for evaluating actual antenna characteristics. A couple of new techniques developed for in-situ measurement and visualization of electromagnetic fields are reported. At first, visualization of EM field distributions measured by a freehand scanning sensor on a live video image is described. Secondly, imaging of 2-d RF field distributions incident on a metamaterial absorber is explained. Then, in-situ visualization techniques for EM vectors and RF polarizations are discussed. Such techniques are expected to be quite useful for measuring EM field distributions in various scenarios in the fields of EMC, antennas and propagation.

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“…Nevertheless, the modeling and simulation methods require more reliable practical investigation from efficient experimentations. So, different scanning techniques of EM NF were proposed [27][28][29][30][31][32][33][34][35][36]. But most of the existing measurement techniques are not completely mature for the EM NF radiation characterization of low frequency electrical and power electronic devices.…”

Section: Introductionmentioning

confidence: 99%

Experimental Investigation on the Power Electronic Transistor Parameters Influence to the Near-Field Radiation for the Emc Applications

Manjombe¹,

Azzouz²,

Baudry³

et al. 2011

PIER M

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Abstract-With the increases of the module integration density and complexity in electrical and power electronic systems, serious problems related to electromagnetic interference (EMI) and electromagnetic compatibility (EMC) can occur. For the safety, these disturbing effects must be considered during the electronic equipment design process. One of the concerns on EMC problems is induced by unintentional near-field (NF) radiations. The modeling and measurement of EM NF radiations is one of the bottlenecks which must be overcome by electronic engineers. To predict the unwanted different misbehaviors caused by the EM radiation, NF test benches for the reconstitution of scanning maps at some millimeters of electrical/electronic circuits under test were developed at the IRSEEM laboratory. Due to the difficulty of the design with commercial simulators, the prediction of EM NF emitted by active electronic systems which are usually based on the use of transistors necessitates more relevant and reliable analysis techniques. For this reason, the main focus of this article is on the experimental analysis of EM NF radiated by an MOSFET transistor with changing electrical parameters. Descriptions of the experimental test bench for the EM map scan of transistors radiation are provided. This experimental setup allows not only to detect the EM NF emission but also to analyze the influence of the excitation signal parameters as the cyclic ratio. It is found that the magnetic radiation is maximal when the cyclic ratio is close to 50%. In the future, the technique introduced in this article can be used to evaluate the EM radiation of embedded electronic/electrical devices in order to improve the safety and security of electronic systems.

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Near-field scanner for the accurate characterization of electromagnetic fields in the close vicinity of electronic devices and systems

Cited by 19 publications

References 2 publications

Spatially variant periodic structures in electromagnetics

Spatially variant periodic structures in electromagnetics

In-Situ Measurement and Visualization of Electromagnetic Fields

Experimental Investigation on the Power Electronic Transistor Parameters Influence to the Near-Field Radiation for the Emc Applications

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