2009
DOI: 10.1016/j.ultramic.2009.01.014
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Near-grain-boundary characterization by atomic force microscopy

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Cited by 2 publications
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“…Rugar and Hansma 18 were detailed the grain size measurement of the materials using AFM. AFM has shown wide capability in the characterization of grain boundaries in recent studies, e.g., sliding of grain‐boundary grooving, grain‐boundary sliding and migration, identification of activated slip systems of polycrystalline material surfaces 19,20 . AFM provides nanoscale reliable measurements on the surfaces.…”
Section: Introductionmentioning
confidence: 99%
“…Rugar and Hansma 18 were detailed the grain size measurement of the materials using AFM. AFM has shown wide capability in the characterization of grain boundaries in recent studies, e.g., sliding of grain‐boundary grooving, grain‐boundary sliding and migration, identification of activated slip systems of polycrystalline material surfaces 19,20 . AFM provides nanoscale reliable measurements on the surfaces.…”
Section: Introductionmentioning
confidence: 99%