Results on the investigation of the magnetic properties and microstructure of the as-deposited and annealed at T = 200-700 o C Fe-Zr-N films are presented. The Fe-Zr-N films with the 0.7-µm thickness were deposited by RF sputtering onto glass square substrates. Structural properties of the films were studied by means of the X-ray diffraction technique. The bulk magnetic characteristics of the films have been measured by a vibrating sample magnetometer (VSM). The study of the near-surface magnetic properties of the Fe-Zr-N samples was carried out employing magneto-optical micromagnetometer with a surface sensitivity of about 20 nm of the thickness depth. The strong annealing effect on the values of the coercivity H C and the saturation field H S of the films was revealed. The values of H C and H S of the films, annealed at T = 450 and 500 o C, were found to be minimal. The temperature dependences of H C and H S were explained by microstructure changes of the studied films after their post-deposition heat treatment.