2018
DOI: 10.1016/j.apsusc.2018.01.176
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Near-zero IR transmission of VO2 thin films deposited on Si substrate

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Cited by 18 publications
(11 citation statements)
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“…On the other hand, the transition temperature T t of VO 2 thin films deposited with bias increases significantly compared with those deposited without biasing. VO 2 thin films deposited without biasing show T t of 335 K as we reported previously [23], whereas T t of VO 2 thin films deposited with biasing reaches up to 349 K in this work. Usually the variation of the transition temperature has been associated with the stress and microstructure of the samples [28].…”
Section: Resultssupporting
confidence: 87%
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“…On the other hand, the transition temperature T t of VO 2 thin films deposited with bias increases significantly compared with those deposited without biasing. VO 2 thin films deposited without biasing show T t of 335 K as we reported previously [23], whereas T t of VO 2 thin films deposited with biasing reaches up to 349 K in this work. Usually the variation of the transition temperature has been associated with the stress and microstructure of the samples [28].…”
Section: Resultssupporting
confidence: 87%
“…All the samples show a polycrystalline structure with a few small grains on top of large grains due to secondary nucleation. In our previous work [23], the average grain size of the VO 2 thin films deposited for 2 h (150 nm thick) without substrate biasing was 55.4 nm as shown in Figure 2e. However, the grain size of the VO 2 thin films deposited under the same conditions but with substrate biasing for 2 h (68 nm thick) was much higher and reached 88.6 nm, as shown in Table 1.…”
Section: Resultsmentioning
confidence: 84%
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