“…Some of them are very effective for pigment identification in the special case study, such as reflection visible light imaging microspectroscopy ( Van der Weerd et al, 2003), X-ray microspectroscopy (Cotte et al, 2006(Cotte et al, , 2007, particle induced X-ray emission spectroscopy (PIXE) (De Viguerie et al, 2009), X-ray diffraction (XRD) (Correia et al, 2008;Van der Snickt et al, 2009;Brostoff et al, 2009), X-ray fluorescence (XRF) (Dik et al, 2008;Castro et al, 2008), Fourier transform infrared (FT-IR) spectroscopy (Prati et al, 2010) (attenuated total reflection Fourier transform infrared (ATR-FT-IR) (Marendo et al, 2005;Mazzeo et al, 2007;Mateo et al, 2009) or synchrotron radiation Fourier transform infrared (SR-FT-IR) (Salvado et al, 2005)), Raman spectroscopy (RS) (Ospitali et al, 2006;Hernanz et al, 2006;Bersani et al, 2004), scanning electron microscopy coupled with electron beam microprobe analysis using an energy-dispersive X-ray detector (SEM-EDX) (Colombini et al, 2004;Mazzeo et al, 2004;Peris-Vicente et al, 2009), polarized light microscopy (PLM) (Burgio et al, 2005), and so on. However, the characterization of artistic materials is rather complicated not only because the sample-gathering is restricted on an exceedingly small scale, but also because the samples consist of a complex superimposition of different layers but each being composed of several pigments mixed together (Schmidt et al, 2009;Maravelaki-Kalaitzaki and Kallithrakas-Kontos, 2003).…”