2008
DOI: 10.1051/epjap:2008085
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New approach of both junction and back surface recombination velocities in a 3D modelling study of a polycrystalline silicon solar cell

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Cited by 77 publications
(84 citation statements)
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“…ii) At the back side (z = H) ( Sb is the excess minority carrier recombination velocity on the back of the base [25]. Its expression is obtained from the derivative (Figure 2) …”
Section: D(t) Is the Electron Diffusion Coefficient In The Base Givenmentioning
confidence: 99%
See 1 more Smart Citation
“…ii) At the back side (z = H) ( Sb is the excess minority carrier recombination velocity on the back of the base [25]. Its expression is obtained from the derivative (Figure 2) …”
Section: D(t) Is the Electron Diffusion Coefficient In The Base Givenmentioning
confidence: 99%
“…The influence of Sf max on the temperature can be plotted from a theoretical model of Sf max given by the following expression (25): …”
Section: Maximum Power Point and Efficiencymentioning
confidence: 99%
“…Equation (4) uses the concept of junction recombination velocity Sf that describes how the minority carrier flow through the junction [5,7,9]. Sf can be written as [5,7,9]:…”
Section: Excess Minority Carrier Densitymentioning
confidence: 99%
“…Sf is the minority carrier junction recombination velocity, expresses with two components which describe the solar cell operating point and the looses induced by shunt resistance [12,13].…”
Section: Theorymentioning
confidence: 99%