2004
DOI: 10.1002/pssc.200304328
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New approaches for the production of nano‐, micro‐, and polycrystalline silicon thin films

Abstract: We review current models and propose new approaches for the production of silicon thin films by low temperature plasma processes. Growth models have often been borrowed from those developed for hydrogenated amorphous silicon and are based on surface diffusion of SiH 3 . However, in situ growth studies have also pointed out the fast diffusion of hydrogen and its role in the crystallization of the film through subsurface reactions. Moreover, ions and silicon nanocrystals can also play a crucial role in microcrys… Show more

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Cited by 49 publications
(34 citation statements)
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“…For example, we have deposition rates V d = 0.9 Å /s and V d = 0.5 Å /s for SiH 4 + H 2 + Ar and SiH 4 + H 2 gas mixtures, respectively, at the same power density 63 mW/ cm 2 , pressure 2500 mTorr and deposition temperature of 200°C (Table 1). This increase of deposition rate in the case of H 2 + Ar dilution can be explained by the increase of silane dissociation degree that can lead to both: to increase of radicals flow towards substrate, and to increase nanoparticle formation in the bulk of plasma and their subsequent contribution in the lc-Si:H film growth [1,9]. Fig.…”
Section: Resultsmentioning
confidence: 99%
“…For example, we have deposition rates V d = 0.9 Å /s and V d = 0.5 Å /s for SiH 4 + H 2 + Ar and SiH 4 + H 2 gas mixtures, respectively, at the same power density 63 mW/ cm 2 , pressure 2500 mTorr and deposition temperature of 200°C (Table 1). This increase of deposition rate in the case of H 2 + Ar dilution can be explained by the increase of silane dissociation degree that can lead to both: to increase of radicals flow towards substrate, and to increase nanoparticle formation in the bulk of plasma and their subsequent contribution in the lc-Si:H film growth [1,9]. Fig.…”
Section: Resultsmentioning
confidence: 99%
“…18 Using this region of high pressure where powder formation take place has been used as precursors to deposit silicon nano crystals using square wave modulated discharge. 19 In addition, the use of very high frequency or high pressure could be used to achieve high deposition rates. In the present investigation nc-Si:H films were deposited in a PECVD system at a relatively high rf power 60 W (∼500 mW/cm 2 ) in the pressure range of 2 Torr to 8 Torr.…”
Section: Deposition Ratementioning
confidence: 99%
“…Two families of growth models have been postulated for PECVD of thin film microcrystalline silicon [10].…”
Section: Growth Kineticsmentioning
confidence: 99%