New Approaches to the Direct Measurement of Capacitance

Raven, M.S.; Raven, David J.

doi:10.1155/apec.4.37

Cited by 7 publications

(4 citation statements)

References 1 publication

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“…presented in Table 1 calculated according to (8,9) complex coefficients α 1 and α 2 indicate that the regime of capacitors discharge was underdamped, though it was pretty close to overdamped, as indicates time dependence of the discharge current presented on Fig. 5 Remarks on some factors that affect the accuracy of described method…”

Section: Discussionmentioning

confidence: 87%

“…Another wide spread approach for electrical capacitance measurement implies the determination of time constant of the discharge process [7]. Some other research, focused on electrical capacitance and impedance measurement, have been concentrated on the development of measurement techniques based on the applying of quasi-balanced circuits [8], schemes with phase detectors [9], measurement schemes which imply the applying of various techniques for digital signal processing [10], applying of impedance-to-voltage converters [11], as well as specialized integrated circuit AD5933 [12].…”

Section: Introductionmentioning

confidence: 99%

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Estimation of capacitors stray inductance by the analysis of overdamped discharge current curves

Kostiukov¹

2021

ELECTROTECHNICAL REVIEW

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This paper gives a description of measurement method which can be used in practice of carrying out measurement of stray inductance of tested capacitive object with the unknown value of electrical capacitance. Stray inductance is determined by means of analysis of previously smoothed by the least squares method curves of discharge current caused by overdamped discharge of tested capacitive object. An example of practical implementation and the analysis of factors that affect the accuracy of proposed method are also given.Streszczenie. W artykule opisano metodę pomiarową, która może być zastosowana w praktyce do pomiaru indukcyjności rozproszonej badanego obiektu pojemnościowego przy nieznanej wartości pojemności. Indukcyjność rozproszoną wyznacza się na podstawie analizy wygładzonych wcześniej metodą najmniejszych kwadratów krzywych prądu wyładowania wywołanego rozładowaniem badanego obiektu pojemnościowego. (Oszacowanie indukcyjności rozproszonej kondensatorów na podstawie analizy prądów rozładowania)

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Section: Discussionmentioning

confidence: 87%

Section: Introductionmentioning

confidence: 99%

Estimation of capacitors stray inductance by the analysis of overdamped discharge current curves

Kostiukov¹

2021

ELECTROTECHNICAL REVIEW

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“…The example of practical implementation of this technique is the E7-25 immittance meter, which was used in [4] for the measurements of complex magnetic permeability. Measurement of electrical insulation parameters can be also accomplished utilizing various measurement schemes based on the applying of phase detectors with phase-shifting circuits [5,10], or, according to the terminology of [11], measurement schemes with quasibalanced circuits. Some other approaches to impedance measurement imply the applying of Fourier transform.…”

Section: Introductionmentioning

confidence: 99%

Electrical Capacitance Measurement by Scatter Ellipse Approximation

Kostiukov¹

2020

MEM

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This article is devoted to the substantiation of the possibility of electrical capacitance measurement utilizing equations that are based on the approximation of scattering ellipse, formed by signals proportional to the current flowing through the capacitive tested object and voltage drop on the tested object. On the contrary, to previously developed algorithms, which were based on the approximation of the scattering ellipse by applying the least-squares method, in this case, the approximation was carried out by simply using the values of signals amplitude directly determined from current and voltage curves. The value of the phase shift between the current and voltage curves, which is also necessary to approximate the shape of the scattering ellipse, was determined by using the cross-correlation method. Besides, the article provides formulas for calculating the reactive component of voltage drop on the tested object which is based on the approximation of scattering ellipse without using the least-squares method. Formulas for calculation of the reactive component of the voltage drop on the tested object after the reduction of the quadratic form of the elliptic curve to its canonical form are also given. The results of the impact of the reduction of the quadratic form of scattering ellipse to its canonical form on the value of correlation coefficient between sine curves of current and voltage as well as on the magnitude of major semi-axis and minor semi-axis of scattering ellipse are illustrated. Also, it was shown the relationship between the values of the reactive component of voltage drop on the capacitive tested object, which were determined before the reducing of the quadratic form of scattering ellipse to its canonical form and after such reducing. Despite the rejection of the applying of the least-squares method, to simplify the calculation algorithms, and also despite the presence of a significant noise component in sampled and processed curves of current and voltage, the experimental test has shown the sufficient level of accuracy and, consequently, the possibility of measuring the electric capacitance by approximating the scatter ellipse employing parameters of the quadratic form directly calculated from previously sampled sine curves of current and voltage.

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“…From determining the capacitances, a number of characterization techniques have been developed to assess the geometry of devices, component materials and interfaces. Various methods called as capacitive measurements are available and frequently in the form of capacitance-voltage (C-V) characteristics, such as: phase-sensitive detection, time-encoded ballistic, resonance, and AC bridge methods [1][2][3][4][5][6].…”

Section: Introductionmentioning

confidence: 99%

A Low Cost C8051F006 SoC-Based Quasi-Static C-V Meter for Characterizing Semiconductor Devices

et al. 2012

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AbstrakBerbasiskan SoC (system on-a-chip) C8051F006, -V dijamin oleh fungsi kalibrasi yang dikerjakan oleh program di PC dan diperoleh melalui proses kalibrasi konversi analog ke digital (ADC), konversi digital ke analog (DAC) pada SoC C8051F006, dan sumber tegangan yang dapat diprogram. Percobaan telah dilakukan pada kapasitor 33-pF dan 1000-pF serta tiga diode p-n didapatkan bahwa nilai kapasitor berada dalam rentang nilai tertentu dan diperoleh kurva C-V untuk dioda p-n. Kata Kunci: ADC, kuasi-statis, DAC, pengukur C-V, pengukur kapasitansi, SoC Abstract Based on a C8051F006 SoC (system on-a-chip), a simple and low cost quasi-static capacitancevoltage (C-V) meter was designed and developed to obtain C-V characteristics of semiconductor devices. The developed C-V meter consists of a capacitance meter, a programmable voltage source, a C8051F006

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New Approaches to the Direct Measurement of Capacitance

Cited by 7 publications

References 1 publication

Estimation of capacitors stray inductance by the analysis of overdamped discharge current curves

Estimation of capacitors stray inductance by the analysis of overdamped discharge current curves

Electrical Capacitance Measurement by Scatter Ellipse Approximation

A Low Cost C8051F006 SoC-Based Quasi-Static C-V Meter for Characterizing Semiconductor Devices

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