New experimental setup devoted to the Auger electron–ion coincidence spectroscopy

Ferrand‐Tanaka, Laurence; Simon, M.; Thissen, R.; Lavollée, M.; Morin, Paul

doi:10.1063/1.1145915

Cited by 16 publications

(8 citation statements)

References 7 publications

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“…A similar Auger decay process had been observed for N 2 O, , in which the relaxation mechanism following the terminal nitrogen excitation produces the largest yield of molecular ions (N 2 + and NO + ). Recently, Ferrand-Tanaka et al have found that the N t −N c bond is preferentially broken when the Auger electrons from the 2π state are observed .…”

Section: Resultssupporting

confidence: 66%

Photodissociation of Ozone in the K Edge Region

et al. 1999

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Dissociative dynamics of the K shell excited ozone has been investigated by time-of-flight (TOF) mass spectra of fragment ions for the first time. The TOF spectra were acquired at 0 and 90°relative to the electric vector of linearly polarized soft X-ray. In the K shell excitation at the 529 eV photoabsorption peak, the energetic O + fragment ion was ejected anisotropically, while at the 536 eV band it was isotropic. The β values calculated from simulation of the TOF spectra are consistent with the previous assignments that the 529 eV band is the π* r O T (1s) resonance excitation and that the 536 eV band mainly consists of two transitions, π*(2b 1 ) r O C (1s) and σ*(7a 1 ) r O T (1s) [Gejo et al. Chem. Phys. Lett. 277 (1997) 497]. The TOF spectra show that the π* excitation of terminal oxygen atoms generates more O 2 + fragment than the excitation of the center oxygen atom.

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Section: Resultssupporting

confidence: 66%

Photodissociation of Ozone in the K Edge Region

et al. 1999

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“…All of these studies, which are briefly summarized in , reported very low counting rates and poor electron energy resolution, mainly because they were using constant electric fields for the ion extraction from the interaction region. The first use of a pulsed ion extraction field, which is inhibited during the electron detection in order to preserve the electron energy resolution of a commercial hemispherical analyzer, was reported by Ferrand- Tanaka et al (1995). A clever use of the pulsed time structure of SR was used in these experiments to trigger a sweeping electric field in the interaction region in order to reduce the fortuitous coincidence rate.…”

Section: Auger Electron-ion Coincidences: a Fine Probe For State-to-smentioning

confidence: 99%

High‐resolution Inner‐shell Photoionization, Photoelectron and Coincidence Spectroscopy

Miron

Morin

2011

Handbook of High‐resolution Spectroscopy

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This article gives an overview of high‐resolution photoionization, photoelectron, and coincidence spectroscopies of inner‐shell excited species of increasing complexity ranging from atoms to nanoparticles. The development and the routine use of soft X‐ray techniques is intimately related to the spectacular advances in instrumentation in the last twenty years. These concern not only the construction and operation of high‐performance soft X‐ray beamlines at several synchrotron radiation laboratories around the world but also the remarkable improvement in charged particle analyzers and detectors (detection efficiency, resolution) and the extensive use of multidimensional coincidence techniques that allows simultaneous acquisition and further correlation of several physical parameters. From the examples we have chosen to present, it is apparent that inner‐shell ionization studies are not limited anymore by the lifetime broadening effects and that a deep and unique insight into ultrafast dynamics is possible. Various examples are shown of both pure high‐resolution photoionization and electron spectroscopies together with more sophisticated techniques such as the electron–ion coincidence measurements with energy and angle resolution. A prospective view of the field is given in the end. In particular, the expectations from the next‐generation ultrahigh brilliance X‐ray sources such as energy recovery linacs or free electron lasers are briefly tackled.

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“…In atomic physics, this type of experiment has been performed recently by various authors [44][45][46][47]. Most of them involve the use of the synchrotron radiation to study some resonant features [48] from Auger electron-photoion and photoion-photoion coincidence studies.…”

Section: X-ray Irradiationmentioning

confidence: 99%

“…3) and may reach significant values (Ot = 1 -10 03BCs). To reduce them a post-accelerating system has to be used [44][45][46][47].…”

Section: X-ray Irradiationmentioning

confidence: 99%

The Role of the Auger Mechanism in the Radiation Damage of Insulators

Cazaux

1995

Microsc. Microanal. Microstruct.

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Abstract. 2014 The ionization damage associated with electron and X-ray irradiation of insulating specimens during their investigation by various techniques (EM, AES, XPS, etc) is considered from the point of view of the Auger mechanism. This damage results from the Auger electron transport through the specimen and more specifically from the Auger cascade in the excited atom. After electronic rearrangements, this cascade finally leaves electron vacancies in the uppermost allowed states of the valence band. It is shown that these vacancies may explain various experimental results such as the stimulated desorption of ionic species in halides and oxides as well as the atomic displacements in covalent crystals. A possible way to quantify these effects is shown for the case of X-ray irradiation and for the case of electron irradiation. In the two cases, the correlation between the microscopic mechanisms and their macroscopic consequences, from the point of view of charging effects, is pointed out for the first time. Finally various positive aspects of these effects are outlined. They concern some new methods of characterization and of elaboration in materials science.

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New experimental setup devoted to the Auger electron–ion coincidence spectroscopy

Cited by 16 publications

References 7 publications

Photodissociation of Ozone in the K Edge Region

Photodissociation of Ozone in the K Edge Region

High‐resolution Inner‐shell Photoionization, Photoelectron and Coincidence Spectroscopy

The Role of the Auger Mechanism in the Radiation Damage of Insulators

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