New technique for testing of delay fault in cluster based FPGA

Das, Nachiketa; Roy, Pranab; Rahaman, Hafizur

doi:10.1109/mwscas.2011.6026578

Cited by 1 publication

(2 citation statements)

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“…The method in [15] presents BIST architecture for testing of stuck‐at‐faults, delay faults and bridging faults in FPGA interconnect. The scheme [2, 16] proposes the diagnosis of delay fault for most of the resources of FPGAs. The dynamic delay model of LUT in FPGA has been explained using resistor–capacitor (RC) model [12].…”

Section: Introductionmentioning

confidence: 99%

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Built‐in‐self‐test technique for diagnosis of delay faults in cluster‐based field programmable gate arrays

Das

Roy

Rahaman

2013

IET Computers & Digital Techniques

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The increased circuit complexity of field programmable gate array (FPGA) poses a major challenge in the testing of FPGAs. One of the test challenges is to detect the delay faults in high-speed circuits. Built-in-self-test (BIST) Technique is an ease solution compared with expensive automatic test equipment. In this work, a BIST structure is proposed to detect the delay faults in the various resources of the FPGA such as multiplier, digital signal processing (DSP) block, look-up tables etc. and interconnects of FPGA. The authors have also proposed a full-diagnosable BISTer structure that improves the testing efficiency of the logic BIST. The proposed BISTer structure can diagnose the faulty configurable logic block (CLB), when all the CLBs in the 2 × 3 BIST are faulty. The proposed scheme has been simulated in Xilinx Vertex FPGA, using ISE tool, Jbits3.0 API and XHWI (Xilinx HardWare Interface) and MATLAB7.0. The result shows significant improvement compared with earlier BIST methods.

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Section: Introductionmentioning

confidence: 99%

“…Section 2 describes the proposed test method. The implementation of BISTer structure and new full‐diagnosable BIST architecture suitable for testing delay fault and the implementation details are presented in Section 3 [Preliminary version of this work was published in ASQED [1], MWSCAS [2]. ].…”

Section: Introductionmentioning

confidence: 99%