2014
DOI: 10.9790/4861-06621220
|View full text |Cite
|
Sign up to set email alerts
|

New way to overcome on the mirror effect for imaging the surface of insulator

Abstract: This work use the ion beam of a focused ion beam (FIB)/scanning electron microscope (SEM) microscope to investigate the ion mirror effect (IME) on the poly-methyl-methacrylate (PMMA). From study of parameter that influence the ion mirror effect (IME), we find easy and fast way to imaging the surface of the sample. To our knowledge this is the first observation of what can be called 'Imaging by Different Currents (IDC). This way is based on the measurement of the trapped charge as well as to evaluate the charge… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Year Published

2018
2018
2022
2022

Publication Types

Select...
3
1

Relationship

0
4

Authors

Journals

citations
Cited by 4 publications
references
References 10 publications
0
0
0
Order By: Relevance