Noise analysis of low noise, high count rate, PIN diode X-ray detectors

Zhou, Chunzhi; Warburton, W. K.

doi:10.1109/23.507071

Cited by 6 publications

(7 citation statements)

References 13 publications

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“…The circuit response H(ro) will be different for series and parallel noise sources, leading to the important distinction in the dependence of output noise on peaking time. Other authors [8], [10], [11] extended noise index analysis to lIt: and Ilf, and Lorentzian noise terms, where the weighting function arises from a convolution of the noise spectrum density N(ro) and the circuit response H(ro).…”

Section: Noise Analysis Methodsmentioning

confidence: 99%

“…A noise weighting function W(t) is defined to be the output at a measuring time Tm of a noise impulse delivered by a noise generator at time t prior to Tm [8]. As a specific physical example, consider shot noise, which arises from discrete electrons passing through the junction of a diode.…”

Section: Noise Analysis Methodsmentioning

confidence: 99%

“…In conventional frequency domain filter theory, the rms fluctuation at the output is expressed as the equivalent noise charge (QENC or ENC), and from (3), given by (8) There are many sources of both current and voltage noise. In most cases, the dominant current noise sources are shot noise from detector leakage current and thermal noise from parallel resistance.…”

Section: B Noise Analysismentioning

confidence: 99%

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Monte Carlo time domain noise simulation in nuclear electronics

Redus¹,

Huber²

2008

2008 IEEE Nuclear Science Symposium Conference Record

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Since radiation detectors and associated electronics operate on pulses, time domain or transient simulations are used but neglect electronic noise. Traditional noise analysis yjelds the rms magnitude of noise fluctuations but does not show how noise affects time-variant or nonlinear circuits. These effects are not well described by either noise-free time domain analyses or noise analyses, which yjeld only the rms magnitude of the noise.We have developed software that produces a time domain simulation, which represents electronic noise as a randomly varyjng waveform.The waveform is simulated as a superposition of random noise impulses into the preamplifier, with the appropriate noise weighting functions and with amplitude and frequency derived from the electrical parameters of the circuitry. The result has an accurate rms amplitude and frequency spectrum, including white series noise, white parallel noise, and series llf noise terms. The software combines this random electronic noise, time variant processes such as variations in detector risetime or pulse pile-up, and models both time-invariant and time-variant circuitry.It provides a physically intuitive and quantitative connection between noise sources, noise weighting functions, and a noisy waveform. This software was been used in designing the latest generation of Amptek's digital processor but is generally applicable for many different systems.

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Section: Noise Analysis Methodsmentioning

confidence: 99%

Section: Noise Analysis Methodsmentioning

confidence: 99%

Section: B Noise Analysismentioning

confidence: 99%

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Monte Carlo time domain noise simulation in nuclear electronics

Redus¹,

Huber²

2008

2008 IEEE Nuclear Science Symposium Conference Record

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“…However, both works are based on Carson's and Campbell's theorems and these theorems assume noise stationarity ( [8], [10]). As the noise at the output of time variant shaper is not stationary, the proof of the methods applied in [24] and [25] remains unclear.…”

Section: Computation Of the Time Variant Transfer Functionmentioning

confidence: 99%

“…Some previous works use the Fourier transform of the noise weighting function to analyze the noise in frequency domain ( [24], [25]). However, both works are based on Carson's and Campbell's theorems and these theorems assume noise stationarity ( [8], [10]).…”

Section: Computation Of the Time Variant Transfer Functionmentioning

confidence: 99%

Noise Analysis of Time Variant Shapers in Frequency Domain

Gascón

Bota

Diéguez

et al. 2011

IEEE Trans. Nucl. Sci.

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In this paper we discuss the noise analysis of time variant shapers in the frequency domain, based on well established concepts of the theory of time varying circuits. A frequency domain extension of the techniques typically adopted for noise analysis in detector instrumentation is proposed and applied to a classic time variant shaper: the gated integrator. In some cases, this frequency domain method makes easier the study of systems in which one of the blocks or noise sources is better described in the frequency domain. In that sense, a practical case involving a gated integrator and a Correlated Double Sampler (CDS) time variant shaper is presented. Index Terms-1 noise, correlated double sampler (CDS), gated integrator, low noise electronics, time variant shapers, time varying circuits.

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Comparison of silicon pin diode detector fabrication processes using ion implantation and thermal doping

Zhou

Warburton

1996

Nuclear Instruments and Methods in Physics Research Section A:

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Noise analysis of low noise, high count rate, PIN diode X-ray detectors

Cited by 6 publications

References 13 publications

Monte Carlo time domain noise simulation in nuclear electronics

Monte Carlo time domain noise simulation in nuclear electronics

Noise Analysis of Time Variant Shapers in Frequency Domain

Comparison of silicon pin diode detector fabrication processes using ion implantation and thermal doping

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