Noise power sensitivities and noise figure minimization of two-ports with any internal topology

Abstract-The noise wave approach is applied to analysis, modeling, and measurement applications. Methods are presented for the calculation of component and network noise wave correlation matrices. Embedding calculations, relations to twoport figures-of-merit, and transformations to traditional representations are discussed. Simple expressions are derived for MESFET and HEMT noise wave parameters based on a linear equivalent circuit. A noise wave measurement technique is presented and experimentally compared with the conventional method.

show abstract

“…[6] and Dobrowolski [7], [8] have presented CAD algorithms strictly in terms of noise waves and scattering parameters.…”

mentioning

confidence: 99%

Wave techniques for noise modeling and measurement

Wedge

Rutledge

1992

IEEE Trans. Microwave Theory Techn.

161

118

View full text Add to dashboard Cite

show abstract

“…n Ma Qc c Ma Qc c ΛC Λ (18) In (18), C T represents the noise wave contribution to n c by the 50 Ω termination at port 5 or 6, depending on which port the reflective load is connected to. C T for the matched 50 ohm termination is given by 00 01…”

Section: Calibrationmentioning

confidence: 99%

A Low-Cost Noise Wave Correlator for Noise Parameters Extraction by Cold Noise Power Measurement

Ahmed¹,

Yeom²

2016

IJWMT

View full text Add to dashboard Cite

Conventionally, the noise parameters of a Device under Test (DUT) which generally characterize the noise performance of the DUT, are obtained via the impedance tuner technique. The authors have previously presented a technique which eliminates the need for impedance tuner, and rather employs an 8-port network that enables the extraction of the noise correlation matrix of a given DUT and thus its noise parameters. In this paper, we present a further simplification of the 8-port network technique, which also eliminates the need for a conventional external noise source. Cold noise powers emanating from a DUT are measured via a 6-port network with the aid of matched termination. The measured noise powers provide sufficient information for determining the noise wave correlation matrix of a DUT, which are then converted into the conventional 2-port noise parameters. The proposed technique is simple, fast and is verified to give a good estimation of the noise parameters of selected DUTs.

show abstract

“…The first category involves the forward and reverse noise measurements based on the concept of noise wave [4][5][6][7][8][9][10][11][12][13][14][15][16][17][18][19][20][21][22]. The wave-based approach, first introduced by P. Penfield in [4], has been reviewed in details in [23] and therefore will not be discussed in this paper.…”

Section: Introductionmentioning

confidence: 99%

Accuracy Issues of on-Wafer Microwave Noise Measurements

Chen

2008

Fluct. Noise Lett.

View full text Add to dashboard Cite

Communicated by François DannevilleThe accuracy issues of on-wafer noise characterization for a linear noisy two-port are presented in this paper. It starts with the description of a microwave noise measurement system and the possible source of error due to the microwave power meter in the measurement system. With the description of noise characterization techniques, this paper reviews a couple of methods for noise parameter extraction to handle the errors in the measured noise powers, noise factors, and source admittances. It also presents the methods to extract the physical noise parameters and to take care of different source admittances in the hot and cold states for accuracy enhancement.

show abstract

Noise power sensitivities and noise figure minimization of two-ports with any internal topology

Cited by 11 publications

References 20 publications

Wave techniques for noise modeling and measurement

Wave techniques for noise modeling and measurement

A Low-Cost Noise Wave Correlator for Noise Parameters Extraction by Cold Noise Power Measurement

Accuracy Issues of on-Wafer Microwave Noise Measurements

Contact Info

Product

Resources

About