2011
DOI: 10.1016/j.ejps.2011.06.017
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Non-destructive analysis of tablet coatings with optical coherence tomography

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Cited by 78 publications
(62 citation statements)
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“…However, it can be very effective in measurements of technical samples as well. Till now OCT OCT has been used: as a three-dimesional imaging technique for roll-to-roll coated polymer solar cells 7 , where it was used to identify coating defects in the functional layers; in observations of biofilm formation and growth on a water purification membrane 8 ; to anayse a tablet coating layers 9 . OCT has been also applied in measurements of liquid crystal displays (LCD) 10 .…”
Section: Optical Coherence Tomographymentioning
confidence: 99%
“…However, it can be very effective in measurements of technical samples as well. Till now OCT OCT has been used: as a three-dimesional imaging technique for roll-to-roll coated polymer solar cells 7 , where it was used to identify coating defects in the functional layers; in observations of biofilm formation and growth on a water purification membrane 8 ; to anayse a tablet coating layers 9 . OCT has been also applied in measurements of liquid crystal displays (LCD) 10 .…”
Section: Optical Coherence Tomographymentioning
confidence: 99%
“…Wiesner et al used ultra-high-resolution OCT system for in situ subsurface nondestructive examination of laser micro-machined surfaces [8]. Ultra-high-resolution OCT has also been used for non-destructive analysis of tablet coatings [9], sub-surface inspection of silicon integrated chips [10] and strain mapping [11]. In all these applications, OCT has been used for noninvasive characterization of dielectric and nonmetallic surfaces.…”
Section: Introductionmentioning
confidence: 98%
“…In order to be able to do so, the tablets had to be split before the measurement. Koller et al [9] as well as Zhong et al [10] applied optical coherence tomography as a further non-destructive method to determine coating thickness. Zhong et al [10] and Russe et al [11] used Terahertz pulsed imaging (TPI) for measurement of layer thickness.…”
Section: Introductionmentioning
confidence: 99%