Non-invasive Delay State Calibration of Silicon Optical Switching Delay Line

Shi, Shangqing; Lin, Dongdong; Liu, Pengcheng; Hu, Guohua; Lin, Tong; Yun, Binfeng; Cui, Yiping

doi:10.1109/jlt.2022.3195348

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2024

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“…Non-invasive characterization techniques have recently been studied in the literature, such as using intermediate phase shifters in the delay stages as monitoring elements that avoid adding losses [25], or techniques that rely on optimization algorithms to reduce the standard deviation in the optical response of the delay lines [26].…”

Section: Introduction and Contextmentioning

confidence: 99%

Nonintrusive Characterization Method for Integrated Optical Delay Lines

Martínez-Carrasco,

Huy-Ho,

Capmany

2024

J. Lightwave Technol.

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In this work we present an automatic calibration technique for switched Optical True Time Delay Lines which allows the control of all of the switchers without relaying on intermediate attenuators nor external test ports, thus optimizing the number of active elements on chip and the footprint. This technique has been used for the characterization of a delay line fabricated on a silicon photonic chip.The accuracy and reliability of this technique were validated for applications beyond beamforming by utilizing the calibration data to synthesize variable optical interleavers.

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Section: Introduction and Contextmentioning

confidence: 99%