Non-Smooth Dynamics of Tapping Mode Atomic Force Microscopy

Belardinelli, Pierpaolo; Chandrashekar, Abhilash; Alijani, Farbod; Lenci, Stefano

doi:10.1115/detc2022-88005

Cited by 1 publication

(1 citation statement)

References 45 publications

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“…Almost four decades after its invention, atomic force microscopy (AFM) has become a standard tool to generate high-quality topographic images and produce high-resolution compositional mapping of the surface mechanical, chemical and electrical properties [1][2][3][4][5]. In recent years, multi-frequency AFM has been in the focus of attention of scanning probe microscopy researchers.…”

Section: Introductionmentioning

confidence: 99%

Simultaneous resonance in multi-frequency atomic force microscopy

Kouchaksaraei,

Bahrami

2023

Preprint

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We propose a new excitation technique based on simultaneous resonance phenomenon to improve performance of the multi-frequency atomic force microscopy. Simultaneous resonances, activated due to the nonlinear nature of the tip oscillations and intermodal couplings for a certain family of multi-frequency excitations, may be used to gather more information about the sample. We consider a non-contact atomic force microscope and model the three-dimensional probe-tip structure as an Euler-Bernoulli beam. Equations governing motion of the probe tip are obtained employing the Hamilton extended principle. Direct harmonic balance method is then used to solve these equations. It is found out, through extensive numerical simulations, that the present excitation scheme improves both the vertical resolution and the compositional contrast of images. Numerical investigations demonstrate that a small change in the Hamaker constant and the initial tip-sample distance leads to a significant change in the amplitude and/or phase shift of the simultaneous resonance. High sensitivity of the amplitude to the initial tip-sample distance can be utilized to reduce vertical noise, and therefore increase the vertical resolution in environments with high and low quality factors. Also, simultaneous resonance phase shift sensitivity to the Hamaker constant is noticeably increased compared to that of the conventional multi-frequency atomic force microscopy. As a result, the compositional contrast is considerably enhanced.

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