2011
DOI: 10.1021/la1046172
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Noncontact Method for Calibration of Lateral Forces in Scanning Force Microscopy

Abstract: This paper describes a noncontact calibration procedure for lateral force microscopy in air and liquids. The procedure is based on the observation that the sensitivity of a force microscope may be calibrated using the raw thermal noise spectrum of the cantilever and its known spring constant, which can be found from the same uncalibrated thermal noise spectrum using Sader's method (Rev. Sci. Instrum.1999, 70, 3967-3969). In addition to the power spectrum of the cantilever thermal noise, this noncontact calibra… Show more

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Cited by 88 publications
(57 citation statements)
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“…Under these assumptions correction for the difference in statically and dynamically deflected cantilevers is unnecessary. A similar conclusion was reached by Wagner et al, 11 and may also be reached by examining the mode shapes of cantilevers subjected to a static torque at their free end 29 and cantilevers free to oscillate torsionally. 30 In cases where the laser or tip is not at the end of the cantilever, a correction factor may be calculated from the tip setback, laser position, and respective mode-shapes.…”
Section: A Thermal Methodssupporting
confidence: 77%
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“…Under these assumptions correction for the difference in statically and dynamically deflected cantilevers is unnecessary. A similar conclusion was reached by Wagner et al, 11 and may also be reached by examining the mode shapes of cantilevers subjected to a static torque at their free end 29 and cantilevers free to oscillate torsionally. 30 In cases where the laser or tip is not at the end of the cantilever, a correction factor may be calculated from the tip setback, laser position, and respective mode-shapes.…”
Section: A Thermal Methodssupporting
confidence: 77%
“…Below we describe the measurements carried out to obtain γ tors by both the thermal noise method 11 and the shape independent method. 18 These measurements were repeated for 8 different cantilevers, 4 made from single crystal silicon (All In One (AIO) probes, with aluminium back side coating, BudgetSensors, Bulgaria) and 4 made from silicon nitride with a gold back side coating (OMCL-RC800, Olympus, Japan also referred to as "ORC-8" by some suppliers).…”
Section: A Afm and Cantileversmentioning
confidence: 99%
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“…The stroke length is much larger than the swollen brush height of h brush E600 nm or the colloidal diameter. We calibrate the normal stiffness of our cantilevers using the thermal noise method as implemented in the Nanoscope 8 software (typically k n ¼ 0.4 N m À 1 ) and the torsional stiffness and sensitivity using the method of Wagner et al 30 (typical stiffness k l ¼ 65 N m À 1 ). After the experiments, the cantilevers are characterized with the high-resolution scanning electron microscope (HR-SEM Zeiss LEO 1550) to obtain the exact dimensions of the colloid and the cantilever (typical length l ¼ 470 mm, width w ¼ 60 mm and thickness t ¼ 3 mm).…”
Section: Methodsmentioning
confidence: 99%