Nondestructive characterization of grain boundary Z‐directional lateral surface in ZnO using nanorobot combined with SEM

Abstract

Different from focusing on grain boundary upper surface in plane X–Y, a unique approach of nanorobot‐based nondestructive characterization of grain boundary Z‐directional lateral surface within bulk ZnO ceramic can be creatively developed under scanning electron microscope (SEM). By rolling‐over bulk ZnO, two‐dimensional profiles and grain boundaries in Z‐directional lateral surfaces have been imaged in plane Y–Z and individually electrically characterized nondestructively. Experiments demonstrate that it is feasible to realize nondestructive characterization of grain boundary Z‐directional lateral surface structures and electrical properties using nanorobot combined with SEM. Relative height differences between grain boundaries within Z‐directional lateral surface can characterize the relative position relationships. Z‐directional lateral surface structures can further extend irregular grain boundary lengths in plane Y–Z to interpret surface effects of nonlinear electrical properties. Relative minor electrical reactive effects in grain indicate grain boundary dominate in nonlinear macroscopic electrical properties. Furtherly, it can be advanced to promote a nondestructive characterization of grain boundary.