2009
DOI: 10.1109/tasc.2009.2019252
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Nondestructive Investigation of Position Dependent $I_{\rm c}$ Variations in Multi-Meter Coated Conductors

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Cited by 19 publications
(14 citation statements)
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“…Critical currents as well as n-values of all types of characterized tapes are listed in table 1 Surprisingly, n-values of the AMSC tape are not dependent on the angle of magnetic field, even though some correlation between n-values and critical current exists also in RABiTS AMSC tape as presented in [2]. Figures 2 and 5 are even showing signs of inverse J c -n-value correlation, which will be discussed later in this paper.…”
Section: Tapes In Low Magnetic Fieldsmentioning
confidence: 83%
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“…Critical currents as well as n-values of all types of characterized tapes are listed in table 1 Surprisingly, n-values of the AMSC tape are not dependent on the angle of magnetic field, even though some correlation between n-values and critical current exists also in RABiTS AMSC tape as presented in [2]. Figures 2 and 5 are even showing signs of inverse J c -n-value correlation, which will be discussed later in this paper.…”
Section: Tapes In Low Magnetic Fieldsmentioning
confidence: 83%
“…Figures 2 and 5 are even showing signs of inverse J c -n-value correlation, which will be discussed later in this paper. In numerous experimental studies, it has been observed that n-values are usually correlated with critical currents [1,2,30], which causes that n-value varies also with external magnetic field. However, if the correlation is a consequence of relation presented by Zeldov et al [31], then:…”
Section: Tapes In Low Magnetic Fieldsmentioning
confidence: 99%
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“…A core capability at Los Alamos is a single-pass method for characterizing in-field uniformity where I c (H||ab) and I c (H||c) are measured as a function of position, in increments as short as 0.5 cm, at 75 K and 0.5 T [10]. At the present, the apparatus can perform I c (H||c) measurements up to 1.4 T. In the apparatus, the H||ab plane field, 0.52T is generated by permanent magnets in a goniometer and therefore is not variable.…”
Section: Methodsmentioning
confidence: 99%
“…We had performed a single pass bi-axial field characterization experiment previously on an MOD / RABiTS conductor (a chemical solution deposition process) [5] but we had never performed a characterization test of the single pass bi-axial field characterization method itself: Aside from working with some LANL PLD / IBAD conductor [6], we had limited experience characterizing the superconducting properties of conductors produced by the physical vapor deposition / IBAD method. This measurement was our first 'test of the test' of J c (x) variation identification using single pass, biaxial field, I c characterization.…”
Section: Measurements A) Biaxial Field I C S: Determining J C Uniformmentioning
confidence: 99%