We present a comparative study of the angular dependent critical current density in YBa 2 Cu 3 O 7 films deposited on IBAD MgO and on single crystal MgO and SrTiO 3 substrates. We identify three angular regimes where pinning is dominated by different types of correlated and uncorrelated defects. We show that those regimes are present in all cases, indicating that the pinning mechanisms are the same, but their extension and characteristics are sample dependent, reflecting the quantitative differences in texture and defect density. In particular, the more defective nature of the films on IBAD turns into an advantage as it results in stronger vortex pinning, demonstrating that the critical current density of the films on single crystals is not an upper limit for the performance of the IBAD coated conductors.

Zero-field muon-spin-resonance and lower-critical-field data are presented for a wide range of Th concentrations in Uix Th v Bei3, spanning the region where both a superconducting and a second, lowertemperature phase transition are observed. Overall T-x phase boundaries are assigned and discussed according to the nature of the lower phase transition. Arguments for associating the lower phase with a possible magnetic (time-reversal-violating) superconducting state are given.

No abstract

This paper presents a new finite-element simulation model for computing the electromagnetic properties and AC losses in systems of YBCO (yttrium barium copper oxide) conductors on roll assisted biaxially textured substrates (RABiTS). In this model, the magnetic field dependent permeability and ferromagnetic loss of the substrates in RABiTS YBCO tapes are taken into account. The simulations were employed to simulate the AC loss in stacks of two parallel connected YBCO tapes. The simulation results are compared with the experimental data to check the validity of the simulation model. The result reveals an effective way of significantly reducing AC loss in YBCO tapes by stacking two RABiTS YBCO coated conductors with the appropriate relative tape orientation.

No abstract