2011
DOI: 10.1002/rcm.5102
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Nonlinear behavior during semi‐quantitative analysis of thin organic layers by laser desorption mass spectrometry

Abstract: Characterization of the surface coverage and thickness of an organic thin film is particularly important in organic electronics and optoelectronics. For surface coverage down to the submonolayer level there is still a need for characterization methods which are easily applicable. In the present work we report on the evaluation of laser desorption mass spectrometry (LD-MS) for its use in thickness determination of organic thin films. Whereas LD-MS is well established as a soft ionization method for small molecu… Show more

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Cited by 2 publications
(1 citation statement)
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“…Two mass peaks caused by impurities are marked by asterisks; they are seen more clearly in the inset in the upper panel and attributed to OHbc + and (H 2 O) 2 Hbc + . A more detailed view of the mass spectrum is provided in the Supplementary Materials (Figure S1a) , where we also compared the current results with previous reports [ 40 , 41 ].…”
Section: Resultsmentioning
confidence: 83%
“…Two mass peaks caused by impurities are marked by asterisks; they are seen more clearly in the inset in the upper panel and attributed to OHbc + and (H 2 O) 2 Hbc + . A more detailed view of the mass spectrum is provided in the Supplementary Materials (Figure S1a) , where we also compared the current results with previous reports [ 40 , 41 ].…”
Section: Resultsmentioning
confidence: 83%