Abstract. An efficient numerical scheme is described for the solution of certain types of nonlinear hyperbolic equations with an integral constraint which are used to model the Gunn effect in semiconductors with impurity capture. We analyze the stability and convergence properties of the scheme and present the results of numerical simulations. Depending on the value of the parameters defining the problem, a great variety of solutions are obtained, including periodic recycling of solitary waves and chaotic regimes.Key words. Gunn effect, oscillations, chaos, numerical simulation, stability, convergence AMS subject classifications. 35L70, 39A11, 65M06, 65M12, 65C20 PII. S00361429993602871. Introduction. Pattern formation and oscillatory phenomena involving recycling and motion of charge dipole waves have often been observed in semiconductors displaying nonlinear electrical conduction. These phenomena were first observed by Gunn [9] in bulk n-type GaAs for which the electron velocity is an N-shaped function of the electric field. When planar contacts are attached to an n-GaAs sample and an appropriate dc voltage bias is kept between them, there appear self-sustained oscillations of the current with frequencies in the microwave range. These oscillations are accompanied by periodic recycling and motion of charge density dipole waves (solitary waves of the electric field).After Gunn's discovery, many materials were shown to have similar current selfoscillations, although the physical mechanisms causing the oscillations were often very different. However, all these materials had N-shaped current-voltage characteristics, which is an essential feature of the Gunn effect (see [2]). N-shaped current-voltage characteristics can appear due to impurity capture processes; such is the case in pGe [19] and many other semiconductors [16]. Precise measurements of the Gunn effect in p-Ge are reported in [14] and [18]. Experiments show that intermittency and spatiotemporal chaos are observed in addition to the usual time periodic oscillations [14].The Gunn effect and other instabilities of the current have been studied by analyzing models of charge transport in semiconductors (see [16], [17]). For bulk semiconductor devices, charge transport may be described by the semiclassical Boltzmann equation or hydrodynamic or drift-diffusion models. Each class of models describes phenomena occurring at a different length and time scales [17]. For sufficiently large devices, hydrodynamic or drift-diffusion descriptions are appropriate and involve less computational cost.