1999
DOI: 10.1109/22.754870
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Nonreciprocal cell for the broadband measurement of tensorial permeability of magnetized ferrites: direct problem

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Cited by 29 publications
(21 citation statements)
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“…In order to correctly interpret the measurements, it is necessary to provide a suitable characterization of the waves inside the waveguide. This is well known for isotropic materials [2,3,12,20], bi-isotropic (chiral) materials [9,17], and even anisotropic materials where an optical axis is along the waveguide axis [1,10,15,16], but for general bianisotropic media with arbitrary axes there are so far very few results available. In principle, an optimization approach as in [12] and [16] can be designed, where the material parameters are found by minimizing the distance between measured and simulated S-parameters.…”
Section: Introductionmentioning
confidence: 99%
“…In order to correctly interpret the measurements, it is necessary to provide a suitable characterization of the waves inside the waveguide. This is well known for isotropic materials [2,3,12,20], bi-isotropic (chiral) materials [9,17], and even anisotropic materials where an optical axis is along the waveguide axis [1,10,15,16], but for general bianisotropic media with arbitrary axes there are so far very few results available. In principle, an optimization approach as in [12] and [16] can be designed, where the material parameters are found by minimizing the distance between measured and simulated S-parameters.…”
Section: Introductionmentioning
confidence: 99%
“…In this study we have shown physicochemical and magnetic properties of YIG thin films deposited by a sputtering system. Non-reciprocal effects are obtained in a X-band rectangular waveguide and can be used [5] to characterize the permeability tensor of such films. …”
Section: Resultsmentioning
confidence: 99%
“…these non-reciprocal effects are a new results obtained with such thickness. They are sufficient to be used in a microwave characterization method of anisotropic materials to explore the permeability tensor of such ferrite films [5].…”
Section: Microwave Results and Discussionmentioning
confidence: 99%
“…Benefits over alternative methods, such as free-space systems, include the availability of analytical expressions to describe sample interrogation, high signal strength, and the simplicity of manufacturing rectangular samples [6][7][8][9]. The S-parameters measured with a material sample placed in the cross-sectional plane of a waveguide may be used to determine the complex values of the permittivity, = 0 ( r − j r ), and the permeability, μ = μ 0 (μ r − jμ r ), from closed-form expressions [13,14].…”
Section: Introductionmentioning
confidence: 99%