“…In order to correctly interpret the measurements, it is necessary to provide a suitable characterization of the waves inside the waveguide. This is well known for isotropic materials [2,3,12,20], bi-isotropic (chiral) materials [9,17], and even anisotropic materials where an optical axis is along the waveguide axis [1,10,15,16], but for general bianisotropic media with arbitrary axes there are so far very few results available. In principle, an optimization approach as in [12] and [16] can be designed, where the material parameters are found by minimizing the distance between measured and simulated S-parameters.…”