2009
DOI: 10.1063/1.3207887
|View full text |Cite
|
Sign up to set email alerts
|

Nonuniform doping distribution along silicon nanowires measured by Kelvin probe force microscopy and scanning photocurrent microscopy

Abstract: We use Kelvin probe force microscopy and scanning photocurrent microscopy to measure the doping distribution along single phosphorous-doped silicon nanowire grown by the vapor-liquid-solid method. A nonlinear potential drop along biased silicon nanowires is detected both by measuring the surface potential directly via Kelvin probe force microscopy and by integrating the photocurrent measured by scanning photocurrent microscopy. These variations in the potential and field are further analyzed to extract the lon… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

4
88
0

Year Published

2011
2011
2022
2022

Publication Types

Select...
10

Relationship

0
10

Authors

Journals

citations
Cited by 87 publications
(92 citation statements)
references
References 18 publications
4
88
0
Order By: Relevance
“…thermal evaporation of contact metals) 50,52,53 are only applicable to a certain range of microwire diameters, and are not compatible with many microwire/polymer structures, due to the complexity of the interactions between Fig. 4 Measured I-V data for a 100 mm long CH 3 -terminated (a) p-type and (b) n-type Si microwire with a diameter z 1.5 mm aligned at the PEDOT:PSS:Nafion/glass border, in dark and under solar AM 1.5G illumination.…”
Section: Discussionmentioning
confidence: 99%
“…thermal evaporation of contact metals) 50,52,53 are only applicable to a certain range of microwire diameters, and are not compatible with many microwire/polymer structures, due to the complexity of the interactions between Fig. 4 Measured I-V data for a 100 mm long CH 3 -terminated (a) p-type and (b) n-type Si microwire with a diameter z 1.5 mm aligned at the PEDOT:PSS:Nafion/glass border, in dark and under solar AM 1.5G illumination.…”
Section: Discussionmentioning
confidence: 99%
“…This technique has been used for characterizing various systems like e.g. Si nanowires [1,2,3], colloidal quantum dots [4], VO 2 nanobeams [5], carbon nanotubes [6,7,8,9,10,11,12,13,15] as well as 2D materials like graphene [16,17,18,19,20,21,22,23] and MoS 2 [24,25]. In such nanoscale systems, two mechanisms have been identified for the generation of photocurrent: i) photovoltaic processes where photo-excited carriers are separated by built-in electrical fields and ii) photothermal processes where thermoelectric forces drive carriers through light-induced thermal gradients.…”
Section: Introductionmentioning
confidence: 99%
“…Using a separate substrate for the monolayer formation simplifies the overall surface doping process, does not require the deposition and removal of SiO 2 capping layer, allowing removal of the native oxide layer from the target substrate for enhanced dopant incorporation. Furthermore, intrinsic nanowires doped by MLCD process were shown to exhibit highly uniform longitudinal dopant distribution that is difficult to achieve by in-situ CVD nanowires synthesis 1,9 .…”
Section: Discussionmentioning
confidence: 99%