Normal-Incidence Photoemission Electron Microscopy (NI-PEEM) for Imaging Surface Plasmon Polaritons

Kahl, Philip; Wall, Simone; Witt, C.; Schneider, Christian; Bayer, Daniela; Fischer, Alexander; Melchior, Pascal; Hoegen, M. Horn‐von; Aeschlimann, Martin; Heringdorf, Frank-J. Meyer zu

doi:10.1007/s11468-014-9756-6

Cited by 97 publications

(104 citation statements)

References 21 publications

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“…In addition, the difference in the dispersion of the incoming light field and the SPP causes an interference pattern induced by a beating effect. A normal-incident PEEM setup [57] overcomes both problems, since the phase of the probe pulse would have the same value on every point of the investigated structure. A similar setup has been used to observe circular modes in nano-antennas [58].…”

Section: Imaging Electric Polarization Dynamicsmentioning

confidence: 99%

“…Such a time-resolved photoemission microscopy experiment, referred to as femtosecond normalincidence photoemission microscopy has been pioneered by Kahl et al [57]. It was shown that the change from the commonly used grazing incidence to normal-incidence illumination geometry has a major impact on the achievable contrast and, hence, on the imaging potential of transient local near fields.…”

Section: Imaging Electric Polarization Dynamicsmentioning

confidence: 99%

“…The illumination wavelength is λ=400 nm in all cases. On the right column a M a n u s c r i p t 11 schematic side view of a silver island under laser illumination (blue arrow) for the specific incidence geometries is shown (adapted from [57]). Figure 6 shows examples for time-integrated imaging of 2PPE SPPs excited on Ag islands with excitation under different incident angles using a linear PEEM set-up with a small mirror in the back focal plane [59] and a low energy electron microscope used as a PEEM [60].…”

Section: Imaging Electric Polarization Dynamicsmentioning

confidence: 99%

See 2 more Smart Citations

Space-, time- and spin-resolved photoemission

Schoenhense

Medjanik

Elmers

2015

Journal of Electron Spectroscopy and Related Phenomena

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This article reviews photoemission experiments that simultaneously resolve at least two of the following degrees of freedom: space (real and momentum space), time (intrinsic time scale of a fast experiment or time-of-flight) and spin. In the spatiotemporal domain, imaging of fast processes by PEEM gives direct insight into plasmon dynamics or magnetization processes. In the category real space & spin the novel concept of imaging spin filters is discussed. In the time & spin chapter we address time-of-flight spin detectors and ultrafast spin processes that are accessible by pump-and-probe techniques. A main part of the paper is devoted to the resolution of momentum-space & time. This is implemented in form of the time-of-flight momentum microscope, a very recent development of which the first instrument has been in operation since 2014. In an extended outlook chapter, the potential of new developments and of a novel, highly parallelized delay-line type electron detector will be discussed. The combination of all three degrees of freedom k-space, time & spin is emerging through the combination of the ToF momentum microscope with imaging spin filter. Outline

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Section: Imaging Electric Polarization Dynamicsmentioning

confidence: 99%

Section: Imaging Electric Polarization Dynamicsmentioning

confidence: 99%

Section: Imaging Electric Polarization Dynamicsmentioning

confidence: 99%

See 1 more Smart Citation

Space-, time- and spin-resolved photoemission

Schoenhense

Medjanik

Elmers

2015

Journal of Electron Spectroscopy and Related Phenomena

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show abstract

“…Furthermore the time dependent observation of propagating plasmonic waves by means of two photon photoemission is complicated, because fringe patterns recorded at grazing incidence depend on the propagation directions of plasmonic wave and laser light [8]. While at normal incidence of laser light the observed fringe patterns allow for direct observation of the plasmonic wave packets [9].…”

Section: Introductionmentioning

confidence: 99%

“…A normal incidence laser beam has been achieved by inserting a small mirror inside the back focal plane of the extractor lens [9]. An alternative approach is to bring the light from the back side of the sample.…”

Section: Introductionmentioning

confidence: 99%

A sample holder with integrated laser optics for an ELMITEC photoemission electron microscope

Gierster

Pape

Ünal

et al. 2015

Review of Scientific Instruments

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We present a new sample holder compatible with ELMITEC Photoemission Electron Microscopes containing an optical lens and a mirror. With the integrated optical elements a laser beam is focused from the back side of the sample at normal incidence, yielding a minimum spot size of about 1μm. This opens up new possibilities for local laser excitations in PEEM experiments such as imaging all-optical magnetization switching at a small length scale.

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Imaging Nanoscale Morphology of Semiconducting Polymer Films with Photoemission Electron Microscopy

et al. 2017

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Photoemission electron microscopy in combination with polarized laser light is presented as a tool permitting direct imaging of polymer-chain orientation and local degree of order in semicrystalline samples of semiconducting polymers, a promising class of materials for future electronics. The key advantages of this imaging tool are its nondestructive and fast measurements, straightforward data analysis, the low complexity of sample preparation, and the possibility of performing measurements on a broad variety of technologically relevant substrates. The high spatial resolution of the microscope provides insights into the nanoscale morphology, which is relevant for the material's performance in electronic devices.

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Normal-Incidence Photoemission Electron Microscopy (NI-PEEM) for Imaging Surface Plasmon Polaritons

Cited by 97 publications

References 21 publications

Space-, time- and spin-resolved photoemission

Space-, time- and spin-resolved photoemission

A sample holder with integrated laser optics for an ELMITEC photoemission electron microscope

Imaging Nanoscale Morphology of Semiconducting Polymer Films with Photoemission Electron Microscopy

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