Photomask Technology 2019 2019
DOI: 10.1117/12.2536471
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Novel cleaning technology for nanoparticle removal

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Cited by 3 publications
(2 citation statements)
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“…For the evaluation of the collapse of the fine patterns, the evaluation samples and data were obtained from Kioxia Co., Ltd., and a joint research was conducted. 22 Evaluated sample was MoSi alloy-based attenuated phase shift material of 60-nm height, isolated pattern with minimum size of 50 nm × 75 nm was used.…”
Section: Cleaning Sample and Particle Measuring Methodsmentioning
confidence: 99%
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“…For the evaluation of the collapse of the fine patterns, the evaluation samples and data were obtained from Kioxia Co., Ltd., and a joint research was conducted. 22 Evaluated sample was MoSi alloy-based attenuated phase shift material of 60-nm height, isolated pattern with minimum size of 50 nm × 75 nm was used.…”
Section: Cleaning Sample and Particle Measuring Methodsmentioning
confidence: 99%
“…As reported, water infiltrates the gaps between small patterns via gas dissolution. [19][20][21] The tool and the process developed herein have been used by Tanabe et al 22 to remove particles stuck between small gaps (∼80 nm). A further investigation is required on water infiltration into all gaps with respect to the materials, shape, and surface energy.…”
Section: Model Of Freeze Cleaningmentioning
confidence: 99%