2014
DOI: 10.1002/adma.201401917
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Novel Electroforming‐Free Nanoscaffold Memristor with Very High Uniformity, Tunability, and Density

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Cited by 80 publications
(106 citation statements)
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“…46,51,52 The central image in Figure 3 shows the resistance change in SDC-SrTiO 3 VAN films when an external voltage is applied. When a positive voltage is applied to the as-grown sample, the device resistance changes from low to high values.…”
Section: A Resistive Switching Phenomenamentioning
confidence: 99%
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“…46,51,52 The central image in Figure 3 shows the resistance change in SDC-SrTiO 3 VAN films when an external voltage is applied. When a positive voltage is applied to the as-grown sample, the device resistance changes from low to high values.…”
Section: A Resistive Switching Phenomenamentioning
confidence: 99%
“…Very recently, as shown in Figure 1(d), new and novel device architectures, vertically aligned nanostructured (VAN) films, [43][44][45][46][47][48][49][50][51][52][53] were developed to overcome several issues in conventional ionic devices as mentioned above. Basically, the development of ionic devices by using VAN films started from a similar motivation of laterally aligned heteroepitaxy films.…”
Section: New Device Architectures For Ionic Devicesmentioning
confidence: 99%
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“…1 In these composites, new phenomena also occur giving a very powerful way to tune device functionality. Very high ferroelectric Curie temperatures, 2 strongly improved dielectric tunability, 3 reducing dielectric loss, 4 enhanced multiferroic coupling, 5 photostriction-magnetic coupling, 6 strongly enhanced current densities in superconductors, 7 new kinds of memristor devices, 8 and strongly enhanced ionic conduction at lower temperatures have all been reported. 9,10 However, the understanding and origin of unusual strain states in nanocomposite films have not been explored to date.…”
mentioning
confidence: 99%
“…The system is ideal from the chemical point of view because there is minimal intermixing between the two component phases. 8 A simple model which incorporates thermal expansion mismatch and lattice mismatch strain between the phases was used to understand how and why the in-plane and out-of-plane lattice parameters vary with x in the way they do. Finally, the ferroelectric properties of the films were probed and the enhanced properties observed explained in terms of the strain states observed.…”
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confidence: 99%