10th Annual IEEE (GaAs IC) Symposium, Gallium Arsenide Integrated Circuit. Technical Digest 1988. 1988
DOI: 10.1109/gaas.1988.11021
|View full text |Cite
|
Sign up to set email alerts
|

Novel GaAs FET modeling technique for MMICs

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

1989
1989
2018
2018

Publication Types

Select...
3
1
1

Relationship

0
5

Authors

Journals

citations
Cited by 12 publications
(1 citation statement)
references
References 0 publications
0
1
0
Order By: Relevance
“…Furthermore the frequency iimitations of (1] and [5) have been overcome by a fully analytic solution of the intrinsic Y-parameter equations as in [7] for the circuit of Fig. L First, the external parasitic elements have to be determined by so-called cold modeling at a drain-to-source voltage of 0 V, as described in [! ], [2], and [4]. Then " hot" measured S parameters (Vrls > 0 V) arc de-embedded from the external parasitic elements to obtain the equivalent Y parameters of the intrinsic device.…”
Section: The Small-signal Equivalent Circuitmentioning
confidence: 99%
“…Furthermore the frequency iimitations of (1] and [5) have been overcome by a fully analytic solution of the intrinsic Y-parameter equations as in [7] for the circuit of Fig. L First, the external parasitic elements have to be determined by so-called cold modeling at a drain-to-source voltage of 0 V, as described in [! ], [2], and [4]. Then " hot" measured S parameters (Vrls > 0 V) arc de-embedded from the external parasitic elements to obtain the equivalent Y parameters of the intrinsic device.…”
Section: The Small-signal Equivalent Circuitmentioning
confidence: 99%