Novel Insulator Designs for Superior DC Hold-Off in Bridged Vacuum Gaps

Jaitly, N.C.; Sudarshan, Tangali S.

doi:10.1109/tei.1987.298943

Cited by 26 publications

(16 citation statements)

References 23 publications

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“…This mechanism is similar to that of the chamfered insulator: trapped charge relieved the stress at the triple junction hence increased insula tion capability [7]. Usually, when using the blocking sheet, a sudden breakdown occurred right after the onset of emission current, while without using the blocking sheet, breakdown occurred after a relatively strong emission current.…”

Section: Resultsmentioning

confidence: 73%

Edge breakdown issues in field emission displays

Sudarshan

2001

IEEE Trans. Dielect. Electr. Insul.

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This paper addresses edge breakdown issues in vacuum gap structures similar to field emis sion displays, both from a theoretical and practicai" point of view. Several unique solutions have been developed. After using these technologies, the breakdown voltage of a 750 tim plain-vacuum gap formed by two thin-film electrodes was improved from � 16 to � 24 kV for the first run, and ,-.., 20 to 28 k V for the conditioned regime. The mechanism of breakdown in a plain vacuum gap is discussed.

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Section: Resultsmentioning

confidence: 73%

Edge breakdown issues in field emission displays

Sudarshan

2001

IEEE Trans. Dielect. Electr. Insul.

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“…The spacer surface irregularities, especially at the edge, will directly affect the contact between the spacer and electrodes, which causes triple-junction voids [3][4][5][6][7][8][9] limiting the insulation capability of the spacer. Triple junction is the region where the spacer, electrode, and vacuum meet.…”

Section: A Triple Junction: Conventional Solutionsmentioning

confidence: 99%

“…[3][4][5][6][7][8][9] Common solutions can be summarized as follows: ͑1͒ putting metal inserts into the ends of the insulator. This procedure can significantly increase the surface flashover voltage of the insulator compared to a plain cylinder of a͒ Electronic mail: sudarsha@ece.sc.edu the same material.…”

Section: A Triple Junction: Conventional Solutionsmentioning

confidence: 99%

“…The insulation capability of an FED vacuum gap and spacer is vitally important in improving FED performance, especially for its reliability, phosphor efficiency, brightness, and contrast. 1 Although vacuum insulation in conventional high-vacuum applications has been investigated extensively, [3][4][5][6][7][8][9][10] vacuum insulation in FEDs raises new vacuum insulation issues. In a FED device, the vacuum gap was formed by two thin-film electrodes; the vacuum gap and spacer are in the micrometric regime.…”

Section: Introductionmentioning

confidence: 99%

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Triple-junction issues in field emission displays

Sudarshan

2001

Journal of Vacuum Science &Amp; Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena

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This article addresses triple-junction issues related to vacuum insulation in field emission displays ͑FEDs͒, both from a theoretical and practical point of view. A technique to inhibit the triple-junction initiated breakdown in dielectric spacer insulation has been demonstrated. In order to simulate the vacuum insulation structure in a FED, thin-film electrodes bridged by a thin-wall-structured spacer were used. Using the developed technique, the breakdown voltage was improved from ϳ10 to ϳ21 kV for the first run and ϳ13 to 24 kV for the conditioned regime. The mechanism of breakdown of the solid insulator is discussed.

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“…We further introduce a 1-dimensional charging current density ( a, t ) as j s ( z , t ) = -(1 -7 ) 2 x R e n , ( z , t ) Eliminating -y we can relate the current densities j ( z , t ) and j a ( a , t ) , and reformulate the expression for the external current (6) …”

Section: Ieee Nansactions On Electricalmentioning

confidence: 99%

The effect of insulator charging on breakdown and conditioning

Wetzer

Wouters

1993

IEEE Trans. Elect. Insul.

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As part of a study on HV design concepts for microwave tubes, a number of different insulator designs have been studied. Analysis of the measured dc current, partial discharge activity and breakdown voltage shows that surface charging of insulators is a key mechanism in the breakdown process and in the conditioning process. Insulator parameters are not only the breakdown voltage, but also the conditioning speed, and the sensitivity to gas exposure or charge leakage., In all these respects insulators with a field enhancement at the anode are superior. Field enhancements at the cathode are less harmful if stepped insulator shapes are chosen. Effective conditioning requires at least a limited number of breakdowns. With sufficient conditioning breakdowns, all insulator geometries tested reached a breakdown field exceeding 12 kV/mm.

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Novel Insulator Designs for Superior DC Hold-Off in Bridged Vacuum Gaps

Cited by 26 publications

References 23 publications

Edge breakdown issues in field emission displays

Edge breakdown issues in field emission displays

Triple-junction issues in field emission displays

The effect of insulator charging on breakdown and conditioning

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