Novel magnetic wire fabrication process by way of nanoimprint lithography for current induced magnetization switching

Abstract

Nanoimprint lithography (NIL) is an effective method to fabricate nanowire because it does not need expensive systems and this process is easier than conventional processes. In this letter, we report the Current Induced Magnetization Switching (CIMS) in perpendicularly magnetized Tb-Co alloy nanowire fabricated by NIL. The CIMS in Tb-Co alloy wire was observed by using current pulse under in-plane external magnetic field (HL). We successfully observed the CIMS in Tb-Co wire fabricated by NIL. Additionally, we found that the critical current density (Jc) for the CIMS in the Tb-Co wire fabricated by NIL is 4 times smaller than that fabricated by conventional lift-off process under HL = 200Oe. These results indicate that the NIL is effective method for the CIMS.

Observation of spin–orbit torque-induced magnetization switching in Gd-Fe perpendicular magnetized wire with in-plane exchange bias field

“…19) In our previous study, we have been reported that the J C of CIMS and CIDWM using SOT in rare-earth amorphous perpendicular magnetic materials with low saturation magnetization (M S ) are lower than those in conventional perpendicular magnetic wires because the J C of SOT-CIMS and CIDWM is proportional to the saturation magnetization. [20][21][22][23][24][25][26][27][28][29][30][31][32] In this study, we investigate SOT-CIMS in zero magnetic field by using Gd-Fe alloy and Gd-Fe alloy with IrMn/CoFe multilayered wires. 33)…”