“…For full property mapping, various advanced AFM techniques have been proposed to simultaneously acquire the surface topography and maps of the nanomechanical properties of polymeric materials, ,,− but atomic force microscopy measurements are inherently restricted to the surface. Thus, the volume must be inspected in a layer-by-layer manner to obtain the structural and mechanical information within the bulk of a sample. ,− This nanotomographic information is of particular interest for semicrystalline polymers because not only the nanomechanical properties but also the number, shape, and spatial arrangement of the crystalline component contribute to the macroscopic elasticity and the material strength. ,,,, Other central aspects that influence the large scale material properties are inhomogeneities in the crystallinity (i.e., general density fluctuations), growth of spherulites, , and large-scale differences in the composition and structure caused by liquid–liquid phase separation during the crystallization process. − Additionally, modeling approaches used to predict the viscoelastic behavior of semicrystalline polymers crucially rely on structural information and the nanomechanical properties of the different phases within the material, which are used for model parametrization and validation. ,, In this work, we use the peak-force tapping mode to correlate the morphology of elastomeric polypropylene (ePP) with quantitative mechanical properties, such as elasticity, adhesion, and dissipation. Successive etching provides these physical properties for the layers located beneath the surface.…”