2010
DOI: 10.1021/nn1027278
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Subsurface Imaging of Soft Polymeric Materials with Nanoscale Resolution

Abstract: Nondestructive depth-resolved imaging of ∼20-nm-thick surface layers of soft polymeric materials is demonstrated using amplitude modulation atomic force microscopy (AM-AFM). From a map of amplitude-phase-distance curves, the tip indentation into the specimen is determined. This serves as a depth coordinate for reconstructing cross sections and volume images of the specimen's mechanical properties. Our method reveals subsurface structures which are not discernible using conventional AM-AFM. Results for surfaces… Show more

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Cited by 60 publications
(81 citation statements)
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“…The corresponding plots of <B > as a function of the tip-sample distance are shown in the subsection Collagen lawn and Si substrate (see below). On soft polymeric materials and polymer melts, similar tip oscillation parameters (cantilever type, tip radius, free amplitude A0, and amplitude ratio A/A0) lead to indentations of up to 20 nm 44,51,74 , which is much larger than the values observed for hydrated collagen fibrils. Therefore, we conclude that the collagen fibril is still a solid material at 84% RH, which is in line with the results obtained from the FD data.…”
Section: Amplitude-phase-distance Measurementsmentioning
confidence: 87%
“…The corresponding plots of <B > as a function of the tip-sample distance are shown in the subsection Collagen lawn and Si substrate (see below). On soft polymeric materials and polymer melts, similar tip oscillation parameters (cantilever type, tip radius, free amplitude A0, and amplitude ratio A/A0) lead to indentations of up to 20 nm 44,51,74 , which is much larger than the values observed for hydrated collagen fibrils. Therefore, we conclude that the collagen fibril is still a solid material at 84% RH, which is in line with the results obtained from the FD data.…”
Section: Amplitude-phase-distance Measurementsmentioning
confidence: 87%
“…In fact, the evolution of the atomic force microscope (AFM) is being shaped by the need to provide a full and non-invasive characterization of complex interfaces such as solid-liquid interfaces [1][2][3][4] , heterogeneous polymer interfaces [5][6][7] , energy-storage devices 8 , cells [9][10] or protein membranes [11][12][13][14] . Ideally, those methods should complement the high spatial resolution of AFM with the following properties: (1) material characterization independent of the probe properties; (2) quantitative; (3) minimal tip and sample preparation; and (4) compatible with high-speed data acquisition and imaging.…”
mentioning
confidence: 99%
“…The method has been extensively applied to discriminate nanoscale heterogeneous structures in a variety of materials. [23][24][25][26] However, the phase shift in AM-AFM is determined by the interplay between the viscoelasticity of the materials and adhesive (Fig. 1(a)) is $13.5 nm.…”
mentioning
confidence: 99%